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Results: 20

Authors: MIYAZAKI M YAMAZAKI S SASAKI K ISHIDA H TORAYA H
Citation: M. Miyazaki et al., CRYSTALLOGRAPHIC DATA OF A NEW PHASE OF DICALCIUM SILICATE, Journal of the American Ceramic Society, 81(5), 1998, pp. 1339-1343

Authors: IMAI T HAYASHI S TORAYA H
Citation: T. Imai et al., ACCURACY IN THE QUANTITATIVE PHASE-ANALYSIS OF SILICON NITRIDES, Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 106(8), 1998, pp. 798-807

Authors: NODA Y OHSHIMA K TORAYA H TANAKA K TERAUCHI H MAETA H KONISHI H
Citation: Y. Noda et al., FIRST RESULTS FROM THE CRYSTAL-STRUCTURE ANALYSIS BEAMLINE AT SPRING-8, Journal of synchrotron radiation, 5, 1998, pp. 485-487

Authors: XIAO YN HAYAKAWA S GOHSHI Y OSHIMA N OKUDERA H TORAYA H OHSUMI K
Citation: Yn. Xiao et al., IN-ADVANCE SIMULATION AND CHEMICAL-STATE ANALYSIS BY SPECTRO-DIFFRACTOMETRY, Chemistry Letters, (8), 1998, pp. 761-762

Authors: OKUDERA H TORAYA H
Citation: H. Okudera et H. Toraya, CRYSTAL-STRUCTURE REFINEMENTS OF INXFE3-XO4 (X-LESS-THAN-OR-EQUAL-TO-0.3) SPINELS BY THE RIETVELD METHOD, Zeitschrift fur Kristallographie, 213(9), 1998, pp. 461-465

Authors: TORAYA H
Citation: H. Toraya, WEIGHTING SCHEME FOR THE MINIMIZATION FUNCTION IN RIETVELD REFINEMENT, Journal of applied crystallography, 31, 1998, pp. 333-343

Authors: XIAO Y HAYAKAWA S GOHSHI Y OSHIMA M OKUDERA H TORAYA H OHSUMI K
Citation: Y. Xiao et al., SPECTRO-DIFFRACTOMETRY FOR CHEMICAL-STATE ANALYSIS BASED ON IN-ADVANCE SIMULATIONS, Bulletin of the Chemical Society of Japan, 71(10), 1998, pp. 2375-2380

Authors: TORAYA H
Citation: H. Toraya, A REPORT ON THE ICDD MARCH 1997 ANNUAL-MEETING - INVITED TALKS AND THE POSTER SESSION, Powder diffraction, 12(3), 1997, pp. 187-187

Authors: HASHIMOTO T HIRASAWA R KOBAYASHI T HIRAI H TAGAWA H MIZUSAKI J TORAYA H TANAKA M OHSUMI K
Citation: T. Hashimoto et al., CHARACTERIZATION OF CRYSTAL SYSTEM OF BAPB1-XBIXO3 WITH X-RAY-DIFFRACTION FOR SYNCHROTRON-RADIATION, Solid state communications, 102(7), 1997, pp. 561-564

Authors: OHMASA M OHSUMI K TORAYA H TOKUSHIMAHOUKI H
Citation: M. Ohmasa et al., SYMMETRY INFORMATION INHERENT IN POWDER DIFFRACTION DATA - ALPHA-QUARTZ AND BETA-QUARTZ AS EXAMPLES, Journal of applied crystallography, 30, 1997, pp. 254-258

Authors: TORAYA H HIBINO H OHSUMI K
Citation: H. Toraya et al., NEW POWDER DIFFRACTOMETER FOR SYNCHROTRON-RADIATION WITH A MULTIPLE-DETECTOR SYSTEM, Journal of synchrotron radiation, 3, 1996, pp. 75-83

Authors: GRZETA B TORAYA H BRNICEVIC N BASIC I PLANINIC P
Citation: B. Grzeta et al., AN X-RAY-POWDER DIFFRACTION STUDY OF SR(2)LNTACU(2)O(8), LN=ND,SM,EU,GD, Journal of applied crystallography, 29, 1996, pp. 37-41

Authors: TORAYA H TAKATA M HIBINO H YOSHINO J OHSUMI K
Citation: H. Toraya et al., LONG HORIZONTAL PARALLEL SLITS WITH 0.03-DEGREES ANGULAR RESOLUTION FOR POWDER DIFFRACTION USING SYNCHROTRON-RADIATION, Journal of synchrotron radiation, 2, 1995, pp. 143-147

Authors: TORAYA H OKUDA T
Citation: H. Toraya et T. Okuda, CRYSTAL-STRUCTURE ANALYSIS OF POLYCRYSTALLINE BI3FE5O12 THIN-FILM BY USING ASYMMETRIC AND SYMMETRICAL DIFFRACTION TECHNIQUES, Journal of physics and chemistry of solids, 56(10), 1995, pp. 1317-1322

Authors: TORAYA H TSUSAKA S
Citation: H. Toraya et S. Tsusaka, QUANTITATIVE PHASE-ANALYSIS USING THE WHOLE-POWDER-PATTERN DECOMPOSITION METHOD .1. SOLUTION FROM KNOWLEDGE OF CHEMICAL-COMPOSITIONS, Journal of applied crystallography, 28, 1995, pp. 392-399

Authors: TORAYA H YOSHINO J
Citation: H. Toraya et J. Yoshino, PROFILES IN ASYMMETRIC DIFFRACTION WITH PSEUDO-PARALLEL-BEAM GEOMETRY, Journal of applied crystallography, 27, 1994, pp. 961-966

Authors: GRZETA B TORAYA H
Citation: B. Grzeta et H. Toraya, POWDER-PATTERN-FITTING METHODS IN STRUCTURE DETERMINATION, Croatica chemica acta, 67(2), 1994, pp. 273-288

Authors: TORAYA H HUANG TC WU Y
Citation: H. Toraya et al., INTENSITY ENHANCEMENT IN ASYMMETRIC DIFFRACTION WITH PARALLEL-BEAM SYNCHROTRON-RADIATION, Journal of applied crystallography, 26, 1993, pp. 774-777

Authors: TORAYA H
Citation: H. Toraya, THE DETERMINATION OF UNIT-CELL PARAMETERS FROM BRAGG REFLECTION DATA USING A STANDARD REFERENCE MATERIAL BUT WITHOUT A CALIBRATION CURVE, Journal of applied crystallography, 26, 1993, pp. 583-590

Authors: HUANG TC TORAYA H BLANTON TN WU Y
Citation: Tc. Huang et al., X-RAY-POWDER DIFFRACTION ANALYSIS OF SILVER BEHENATE, A POSSIBLE LOW-ANGLE DIFFRACTION STANDARD, Journal of applied crystallography, 26, 1993, pp. 180-184
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