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Results: 1-25 | 26-33
Results: 1-25/33
EVALUATION OF VALIDITY OF THE DEPTH-DEPENDENT CORRECTION FORMULA (CF)FOR ELASTIC ELECTRON-SCATTERING EFFECTS IN AES AND XPS
Authors: JABLONSKI A TOUGAARD S
Citation: A. Jablonski et S. Tougaard, EVALUATION OF VALIDITY OF THE DEPTH-DEPENDENT CORRECTION FORMULA (CF)FOR ELASTIC ELECTRON-SCATTERING EFFECTS IN AES AND XPS, Surface and interface analysis, 26(5), 1998, pp. 374-384
ACCURACY OF THE NONDESTRUCTIVE SURFACE NANOSTRUCTURE QUANTIFICATION TECHNIQUE BASED ON ANALYSIS OF THE XPS OR AES PEAK SHAPE
Authors: TOUGAARD S
Citation: S. Tougaard, ACCURACY OF THE NONDESTRUCTIVE SURFACE NANOSTRUCTURE QUANTIFICATION TECHNIQUE BASED ON ANALYSIS OF THE XPS OR AES PEAK SHAPE, Surface and interface analysis, 26(4), 1998, pp. 249-269
PRACTICAL CORRECTION FORMULA FOR ELASTIC ELECTRON-SCATTERING EFFECTS IN ATTENUATION OF AUGER ELECTRONS AND PHOTOELECTRONS
Authors: JABLONSKI A TOUGAARD S
Citation: A. Jablonski et S. Tougaard, PRACTICAL CORRECTION FORMULA FOR ELASTIC ELECTRON-SCATTERING EFFECTS IN ATTENUATION OF AUGER ELECTRONS AND PHOTOELECTRONS, Surface and interface analysis, 26(1), 1998, pp. 17-29
THE INELASTIC MEAN FREE-PATH AND THE INELASTIC-SCATTERING CROSS-SECTION OF ELECTRONS IN GAAS DETERMINED FROM HIGHLY RESOLVED ELECTRON-ENERGY SPECTRA
Authors: KRAWCZYK M JABLONSKI A TOUGAARD S TOTH J VARGA D GERGELY G
Citation: M. Krawczyk et al., THE INELASTIC MEAN FREE-PATH AND THE INELASTIC-SCATTERING CROSS-SECTION OF ELECTRONS IN GAAS DETERMINED FROM HIGHLY RESOLVED ELECTRON-ENERGY SPECTRA, Surface science, 404(1-3), 1998, pp. 491-495
POPULATION DEVELOPMENT OF HARBOR SEALS PHOCA-VITULINA IN THE WADDEN SEA AFTER THE 1988 VIRUS EPIZOOTIC
Authors: REIJNDERS PJH RIES EH TOUGAARD S NORGAARD N HEIDEMANN G SCHWARZ J VARESCHI E TRAUT IM
Citation: Pjh. Reijnders et al., POPULATION DEVELOPMENT OF HARBOR SEALS PHOCA-VITULINA IN THE WADDEN SEA AFTER THE 1988 VIRUS EPIZOOTIC, Journal of sea research, 38(1-2), 1997, pp. 161-168
GE GROWTH ON SI(001) STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY PEAKSHAPE-ANALYSIS AND ATOMIC-FORCE MICROSCOPY
Authors: SCHLEBERGER M SIMONSEN AC TOUGAARD S HANSEN JL LARSEN AN
Citation: M. Schleberger et al., GE GROWTH ON SI(001) STUDIED BY X-RAY PHOTOELECTRON-SPECTROSCOPY PEAKSHAPE-ANALYSIS AND ATOMIC-FORCE MICROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(6), 1997, pp. 3032-3035
QUANTITATIVE MODEL OF ELECTRON-ENERGY-LOSS IN XPS
Authors: SIMONSEN AC YUBERO F TOUGAARD S
Citation: Ac. Simonsen et al., QUANTITATIVE MODEL OF ELECTRON-ENERGY-LOSS IN XPS, Physical review. B, Condensed matter, 56(3), 1997, pp. 1612-1619
THE EXCITATION DEPTH DISTRIBUTION FUNCTION FOR AUGER ELECTRONS CREATED BY ELECTRON-IMPACT
Authors: JABLONSKI A TOUGAARD S
Citation: A. Jablonski et S. Tougaard, THE EXCITATION DEPTH DISTRIBUTION FUNCTION FOR AUGER ELECTRONS CREATED BY ELECTRON-IMPACT, Surface and interface analysis, 25(9), 1997, pp. 688-698
QUANTITATIVE XPS - INFLUENCE OF ELASTIC ELECTRON-SCATTERING IN QUANTIFICATION BY PEAK SHAPE-ANALYSIS
Authors: TOUGAARD S JABLONSKI A
Citation: S. Tougaard et A. Jablonski, QUANTITATIVE XPS - INFLUENCE OF ELASTIC ELECTRON-SCATTERING IN QUANTIFICATION BY PEAK SHAPE-ANALYSIS, Surface and interface analysis, 25(6), 1997, pp. 404-408
UNIVERSALITY CLASSES OF INELASTIC ELECTRON-SCATTERING CROSS-SECTIONS
Authors: TOUGAARD S
Citation: S. Tougaard, UNIVERSALITY CLASSES OF INELASTIC ELECTRON-SCATTERING CROSS-SECTIONS, Surface and interface analysis, 25(3), 1997, pp. 137-154
EMISSION-DEPTH DEPENDENCE OF THE SIGNAL PHOTOELECTRON ENERGY-SPECTRUM
Authors: TILININ IS JABLONSKI A TOUGAARD S
Citation: Is. Tilinin et al., EMISSION-DEPTH DEPENDENCE OF THE SIGNAL PHOTOELECTRON ENERGY-SPECTRUM, Surface and interface analysis, 25(2), 1997, pp. 119-131
SURFACE NANOSTRUCTURE DETERMINATION BY X-RAY PHOTOEMISSION SPECTROSCOPY PEAK SHAPE-ANALYSIS
Authors: TOUGAARD S
Citation: S. Tougaard, SURFACE NANOSTRUCTURE DETERMINATION BY X-RAY PHOTOEMISSION SPECTROSCOPY PEAK SHAPE-ANALYSIS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1415-1423
CHARACTERISTIC DEPTH OF THE EXCITATION-FUNCTION FOR AUGER ELECTRONS IN THE NOBLE-METALS CU, AG AND AU DETERMINED BY INELASTIC BACKGROUND ANALYSIS
Authors: SCHLEBERGER M FUJITA D TOUGAARD S
Citation: M. Schleberger et al., CHARACTERISTIC DEPTH OF THE EXCITATION-FUNCTION FOR AUGER ELECTRONS IN THE NOBLE-METALS CU, AG AND AU DETERMINED BY INELASTIC BACKGROUND ANALYSIS, Journal of electron spectroscopy and related phenomena, 82(3), 1996, pp. 173-178
RED LIST OF MARINE MAMMALS OF THE WADDEN SEA
Authors: TOUGAARD S KINZE C BENKE H HEIDEMANN G REIJNDERS PJH LEOPOLD MF
Citation: S. Tougaard et al., RED LIST OF MARINE MAMMALS OF THE WADDEN SEA, Helgolander Meeresuntersuchungen, 50, 1996, pp. 129-136
QUANTITATIVE XPS - NONDESTRUCTIVE ANALYSIS OF SURFACE NANOSTRUCTURES
Authors: TOUGAARD S
Citation: S. Tougaard, QUANTITATIVE XPS - NONDESTRUCTIVE ANALYSIS OF SURFACE NANOSTRUCTURES, Applied surface science, 101, 1996, pp. 1-10
MODEL FOR QUANTITATIVE-ANALYSIS OF REFLECTION-ELECTRON-ENERGY-LOSS SPECTRA - ANGULAR-DEPENDENCE
Authors: YUBERO F SANZ JM RAMSKOV B TOUGAARD S
Citation: F. Yubero et al., MODEL FOR QUANTITATIVE-ANALYSIS OF REFLECTION-ELECTRON-ENERGY-LOSS SPECTRA - ANGULAR-DEPENDENCE, Physical review. B, Condensed matter, 53(15), 1996, pp. 9719-9727
EXPERIMENTAL TEST OF MODEL FOR ANGULAR AND ENERGY-DEPENDENCE OF REFLECTION-ELECTRON-ENERGY-LOSS SPECTRA
Authors: YUBERO F FUJITA D RAMSKOV B TOUGAARD S
Citation: F. Yubero et al., EXPERIMENTAL TEST OF MODEL FOR ANGULAR AND ENERGY-DEPENDENCE OF REFLECTION-ELECTRON-ENERGY-LOSS SPECTRA, Physical review. B, Condensed matter, 53(15), 1996, pp. 9728-9732
ESTIMATION OF EXCITATION DEPTH DISTRIBUTION FROM ELECTRON-EXCITED AUGER-SPECTRA OF IRON USING PEAK SHAPE-ANALYSIS
Authors: FUJITA D SCHLEBERGER M TOUGAARD S
Citation: D. Fujita et al., ESTIMATION OF EXCITATION DEPTH DISTRIBUTION FROM ELECTRON-EXCITED AUGER-SPECTRA OF IRON USING PEAK SHAPE-ANALYSIS, Surface and interface analysis, 24(3), 1996, pp. 211-216
EXTRACTION OF DEPTH DISTRIBUTIONS OF ELECTRON-EXCITED AUGER ELECTRONSIN FE, NI AND SI USING INELASTIC PEAK SHAPE-ANALYSIS
Authors: FUJITA D SCHLEBERGER M TOUGAARD S
Citation: D. Fujita et al., EXTRACTION OF DEPTH DISTRIBUTIONS OF ELECTRON-EXCITED AUGER ELECTRONSIN FE, NI AND SI USING INELASTIC PEAK SHAPE-ANALYSIS, Surface science, 358(1-3), 1996, pp. 180-185
NANOSTRUCTURE OF THIN METAL-FILMS ON SILICON(111) INVESTIGATED BY X-RAY PHOTOELECTRON-SPECTROSCOPY - INELASTIC PEAK SHAPE-ANALYSIS
Authors: SCHLEBERGER M FUJITA D SCHARFSCHWERDT C TOUGAARD S
Citation: M. Schleberger et al., NANOSTRUCTURE OF THIN METAL-FILMS ON SILICON(111) INVESTIGATED BY X-RAY PHOTOELECTRON-SPECTROSCOPY - INELASTIC PEAK SHAPE-ANALYSIS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 949-953
PATH-LENGTH DISTRIBUTION OF PHOTOELECTRONS EMITTED FROM HOMOGENEOUS NONCRYSTALLINE SOLIDS - CONSEQUENCES FOR INELASTIC-BACKGROUND ANALYSIS
Authors: TILININ IS JABLONSKI A TOUGAARD S
Citation: Is. Tilinin et al., PATH-LENGTH DISTRIBUTION OF PHOTOELECTRONS EMITTED FROM HOMOGENEOUS NONCRYSTALLINE SOLIDS - CONSEQUENCES FOR INELASTIC-BACKGROUND ANALYSIS, Physical review. B, Condensed matter, 52(8), 1995, pp. 5935-5946
INTERCOMPARISON OF ALGORITHMS FOR BACKGROUND CORRECTION IN XPS
Authors: JANSSON C TOUGAARD S BEAMSON G BRIGGS D DAVIES SF ROSSI A HAUERT R HOBI G BROWN NMD MEENAN BJ ANDERSON CA REPOUX M MALITESTA C SABBATINI L
Citation: C. Jansson et al., INTERCOMPARISON OF ALGORITHMS FOR BACKGROUND CORRECTION IN XPS, Surface and interface analysis, 23(7-8), 1995, pp. 484-494
TEST OF ELASTIC ELECTRON-SCATTERING CORRECTIONS FOR QUANTITATIVE XPS
Authors: TOUGAARD S JABLONSKI A
Citation: S. Tougaard et A. Jablonski, TEST OF ELASTIC ELECTRON-SCATTERING CORRECTIONS FOR QUANTITATIVE XPS, Surface and interface analysis, 23(7-8), 1995, pp. 559-564
STUDY OF ELECTRON BACKSCATTERING WITHIN THE APPROXIMATION OF DISCRETEFLOWS
Authors: BORODYANSKY S TOUGAARD S
Citation: S. Borodyansky et S. Tougaard, STUDY OF ELECTRON BACKSCATTERING WITHIN THE APPROXIMATION OF DISCRETEFLOWS, Surface and interface analysis, 23(10), 1995, pp. 689-695
GROWTH AND IN-DEPTH DISTRIBUTION OF THIN METAL-FILMS ON SILICON(111) STUDIED BY XPS - INELASTIC PEAK SHAPE-ANALYSIS
Authors: SCHLEBERGER M FUJITA D SCHARFSCHWERDT C TOUGAARD S
Citation: M. Schleberger et al., GROWTH AND IN-DEPTH DISTRIBUTION OF THIN METAL-FILMS ON SILICON(111) STUDIED BY XPS - INELASTIC PEAK SHAPE-ANALYSIS, Surface science, 333, 1995, pp. 942-947
Risultati: 1-25 | 26-33