Authors:
AYRES JR
BROTHERTON SD
MCCULLOCH DJ
TRAINOR MJ
Citation: Jr. Ayres et al., ANALYSIS OF DRAIN FIELD AND HOT-CARRIER STABILITY OF POLY-SI THIN-FILM TRANSISTORS, JPN J A P 1, 37(4A), 1998, pp. 1801-1808
Authors:
BROTHERTON SD
MCCULLOCH DJ
GOWERS JP
AYRES JR
TRAINOR MJ
Citation: Sd. Brotherton et al., INFLUENCE OF MELT DEPTH IN LASER CRYSTALLIZED POLY-SI THIN-FILM TRANSISTORS, Journal of applied physics, 82(8), 1997, pp. 4086-4094
Citation: Sd. Brotherton et al., CONTROL AND ANALYSIS OF LEAKAGE CURRENTS IN POLY-SI THIN-FILM TRANSISTORS, Journal of applied physics, 79(2), 1996, pp. 895-904