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Results:
1-7
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Results: 7
Authors:
MORANT C
SORIANO L
TRIGO JF
SANZ JM
Citation: C. Morant et al., ATOMIC-FORCE MICROSCOPE STUDY OF THE EARLY STAGES OF NIO DEPOSITION ON GRAPHITE AND MICA, Thin solid films, 317(1-2), 1998, pp. 59-63
Authors:
JIMENEZ VM
CABALLERO A
FERNANDEZ A
SANCHEZLOPEZ JC
GONZALEZELIPE AR
TRIGO JF
SANZ JM
Citation: Vm. Jimenez et al., CALIBRATION OF THE PROBING DEPTH BY TOTAL ELECTRON YIELD OF EXAFS SPECTRA IN OXIDE OVERLAYERS (TA2O5, TIO2, ZRO2), Surface and interface analysis, 25(9), 1997, pp. 707-714
Authors:
QUIROS C
PRIETO P
TRIGO JF
ELIZALDE E
SANZ JM
Citation: C. Quiros et al., THIN BN FILMS OBTAINED BY DUAL-ION-BEAM SPUTTERING - AN FT-IR AND SPECTROSCOPIC ELLIPSOMETRY CHARACTERIZATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 275-279
Authors:
BUENO RM
TRIGO JF
MARTINEZDUART JM
ELIZALDE E
SANZ JM
Citation: Rm. Bueno et al., STUDY OF THE OPTICAL-CONSTANTS DETERMINATION OF THIN-FILMS - DEPENDENCE ON THEORETICAL ASSUMPTIONS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(5), 1995, pp. 2378-2383
Authors:
YUBERO F
SANZ JM
TRIGO JF
ELIZALDE E
TOUGAARD S
Citation: F. Yubero et al., QUANTITATIVE-ANALYSIS OF REELS SPECTRA OF ZRO(2) - DETERMINATION OF THE DIELECTRIC LOSS FUNCTION AND INELASTIC MEAN FREE PATHS, Surface and interface analysis, 22(1-12), 1994, pp. 124-128
Authors:
TRIGO JF
ELIZALDE E
QUIROS C
SANZ JM
Citation: Jf. Trigo et al., CHARACTERIZATION OF ZR THIN-FILMS GROWN BY DUAL ION-BEAM SPUTTERING, Vacuum, 45(10-11), 1994, pp. 1039-1041
Authors:
TRIGO JF
ELIZALDE E
SANZ JM
Citation: Jf. Trigo et al., OPTICAL-PROPERTIES OF ZR FILMS GROWN UNDER ION-BOMBARDMENT, Thin solid films, 228(1-2), 1993, pp. 100-104
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1-7
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