Authors:
TSUKAJIMA J
ARAI K
TAKATOH S
ENOKIJIMA T
HAYASHI T
YIKEGAKI T
KASHIWAGI A
TOKUNAGA K
SUZUKI T
FUJIKAWA T
USAMI S
Citation: J. Tsukajima et al., ELECTRON-ENERGY-LOSS FINE-STRUCTURE MEASUREMENTS OF SILICON-NITRIDE FILMS, Thin solid films, 282(1-2), 1996, pp. 318-320
Authors:
HAYASHI T
ARAKI K
TAKATOH S
ENOKIJIMA T
YIKEGAKI T
FUTAMI T
KURIHARA Y
TSUKAJIMA J
TAKAMOTO K
FUJIKAWA T
USAMI S
Citation: T. Hayashi et al., FEASIBILITY OF REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY WITH A SMALL SCATTERING ANGLE FOR RESEARCH IN SURFACE SCIENCE, JPN J A P 1, 34(6A), 1995, pp. 3255-3259
Authors:
HAYASHI T
ARAKI K
TAKATOH S
ENOKIJIMA T
YIKEGAKI T
FUTAMI T
KURIHARA Y
TSUKAJIMA J
TAKAMOTO K
FUJIKAWA T
USAMI S
Citation: T. Hayashi et al., ENERGY-LOSS NEAR-EDGE STRUCTURE FOR MATERIALS CONTAINING LIGHT-ELEMENTS BY REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY, Applied physics letters, 66(1), 1995, pp. 25-27