Authors: PEASE RL COHN LM FLEETWOOD DM GEHLHAUSEN MA TURFLINGER TL BROWN DB JOHNSTON AH

Citation: Rl. Pease et al., A PROPOSED HARDNESS ASSURANCE TEST METHODOLOGY FOR BIPOLAR LINEAR CIRCUITS AND DEVICES IN A SPACE IONIZING-RADIATION ENVIRONMENT, IEEE transactions on nuclear science, 44(6), 1997, pp. 1981-1988

Authors: TURFLINGER TL DAVEY MV MAPPES BM

Citation: Tl. Turflinger et al., SINGLE EVENT EFFECTS IN ANALOG-TO-DIGITAL CONVERTERS - DEVICE PERFORMANCE AND SYSTEM IMPACT, IEEE transactions on nuclear science, 41(6), 1994, pp. 2187-2194