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Taleb-Ibrahimi, A
Calvayrac, Y
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Authors:
Jolly, F
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Taleb-Ibrahimi, A
Citation: F. Jolly et al., Oxidized silicon surfaces studied by high resolution Si 2p core-level photoelectron spectroscopy using synchrotron radiation, J NON-CRYST, 280(1-3), 2001, pp. 150-155
Authors:
Schaub, T
Delahaye, J
Berger, C
Grenet, T
Guyot, H
Belkhou, R
Taleb-Ibrahimi, A
Prejean, JJ
Calvayrac, Y
Citation: T. Schaub et al., High resolution experiment on the electronic density of states in icosahedral-Al-Pd-Mn, MAT SCI E A, 294, 2000, pp. 512-515
Authors:
Aristov, VY
Zhilin, VM
Grupp, C
Taleb-Ibrahimi, A
Kim, HJ
Mangat, PS
Soukiassian, P
Le Lay, G
Citation: Vy. Aristov et al., Photoemission measurements of quantum states in accumulation layers at narrow band gap III-V semiconductor surfaces, APPL SURF S, 166(1-4), 2000, pp. 263-267
Authors:
Jolly, F
Rochet, F
Dufour, G
Grupp, C
Taleb-Ibrahimi, A
Citation: F. Jolly et al., Oxidation of the H-Si(111)-1 x 1 surface: high resolution Si 2p core-levelspectroscopy with synchrotron radiation, SURF SCI, 463(2), 2000, pp. 102-108
Authors:
Aristov, VY
Le Lay, G
Zhilin, VM
Indlekofer, G
Grupp, C
Taleb-Ibrahimi, A
Soukiassian, P
Citation: Vy. Aristov et al., Direct measurement of quantum-state dispersion in an accumulation layer ata semiconductor surface, PHYS REV B, 60(11), 1999, pp. 7752-7755