AAAAAA

   
Results: 1-2 |
Results: 2
RTL-based functional test generation for high defects coverage in digital systems
Authors: Santos, MB Goncalves, FM Teixeira, IC Teixeira, JP
Citation: Mb. Santos et al., RTL-based functional test generation for high defects coverage in digital systems, J ELEC TEST, 17(3-4), 2001, pp. 311-319
Metrics and criteria for quality assessment of testable Hw Sw systems architectures
Authors: Dias, OP Teixeira, IC Teixeira, JP
Citation: Op. Dias et al., Metrics and criteria for quality assessment of testable Hw Sw systems architectures, J ELEC TEST, 14(1-2), 1999, pp. 149-158
Risultati: 1-2 |