Citation: E. Ayyildiz et al., The effect of series resistance on calculation of the interface state density distribution in Schottky diodes, INT J ELECT, 88(6), 2001, pp. 625-633
Citation: E. Ayyildiz et al., Dependence of thermal annealing on the density distribution of interface states in Ti/n-GaAs(Te) Schottky diodes, APPL SURF S, 152(1-2), 1999, pp. 57-62