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Results:
1-9
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Results: 9
Authors:
Franquet, A
De Laet, J
Schram, T
Terryn, H
Subramanian, V
van Ooij, WJ
Vereecken, J
Citation: A. Franquet et al., Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry, THIN SOL FI, 384(1), 2001, pp. 37-45
Authors:
Schram, T
Terryn, H
Citation: T. Schram et H. Terryn, The use of infrared spectroscopic ellipsometry for the thickness determination and molecular characterization of thin films on aluminum, J ELCHEM SO, 148(2), 2001, pp. F12-F20
Authors:
Schram, T
Terryn, H
Franquet, A
Citation: T. Schram et al., Feasibility study to probe thin inorganic and organic coatings on aluminium substrates by means of visible and infrared spectroscopic ellipsometry, SURF INT AN, 30(1), 2000, pp. 507-513
Authors:
Cuynen, E
Goeminne, G
Van Espen, P
Terryn, H
Citation: E. Cuynen et al., Thin film analysis of chromium-phosphate conversion coatings on aluminium probed by ToF-SIMS and electron probe x-ray analysis, SURF INT AN, 30(1), 2000, pp. 589-591
Authors:
Van den Berghe, S
Laval, JP
Gaudreau, B
Terryn, H
Verwerft, M
Citation: S. Van Den Berghe et al., XPS investigations on cesium uranates: mixed valency behaviour of uranium, J NUCL MAT, 277(1), 2000, pp. 28-36
Authors:
Terryn, H
Kernig, B
Hubin, A
Laevers, P
Citation: H. Terryn et al., AC electrograining of aluminium in hydrochloric and nitric acid: a comparative study, T I MET FIN, 78, 2000, pp. 29-34
Authors:
De Graeve, I
Terryn, H
Citation: I. De Graeve et H. Terryn, AC-electrochemical cleaning of aluminium, T I MET FIN, 78, 2000, pp. 35-40
Authors:
Schram, T
Franquet, A
Terryn, H
Vereecken, J
Citation: T. Schram et al., Spectroscopic ellipsometry: a non-destructive technique for surface analysis, ADV ENG MAT, 1(1), 1999, pp. 63-66
Authors:
Cuynen, E
Van Espen, P
Goeminne, G
Terryn, H
Citation: E. Cuynen et al., On the structure and chemical composition of chromium based conversion coatings on aluminium: a TOF SIMS study, J ANAL ATOM, 14(3), 1999, pp. 483-486
Risultati:
1-9
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