Authors:
Vilensky, AI
Larionov, OG
Gainutdinov, RV
Tolstikhina, AL
Kabanov, VY
Zagorski, DL
Khataibe, EV
Netchaev, AN
Mchedlishvili, BV
Citation: Ai. Vilensky et al., The heavy ion tracks in polymers investigation by means of high-effective liquid chromatography and atomic-force microscopy, RADIAT MEAS, 34(1-6), 2001, pp. 75-80
Citation: Nv. Belugina et Al. Tolstikhina, Structure of the polar (010) cleavage of a ferroelectric TGS crystal from the atomic-force microscopy data, CRYSTALLO R, 46(5), 2001, pp. 850-855
Authors:
Shtanko, NI
Kabanov, VY
Apel, PY
Orelovich, OL
Vilenskii, AA
Tolstikhina, AL
Citation: Ni. Shtanko et al., Properties of polymer track membranes modified by grafting with poly(2-methyl-5-vinylpyridine) and poly(N-isopropylacrylamide), RUSS CHEM B, 49(5), 2000, pp. 856-862
Authors:
Kayushina, RL
Tolstikhina, AL
Stepina, ND
Belyaev, VV
Lapuk, VA
Varlamova, EY
Citation: Rl. Kayushina et al., Assembly and structural study of the films of immunoglobulin M on solid substrates, CRYSTALLO R, 45(6), 2000, pp. 1001-1006
Citation: Al. Tolstikhina et al., AFM characterization of domain structure of ferroelectric TGS crystals on a nanoscale, ULTRAMICROS, 82(1-4), 2000, pp. 149-152
Citation: Ai. Vilensky et Al. Tolstikhina, Etching of tracks of accelerated heavy ions in poly(ethylene terephthalate) and some physicochemical properties of track membranes, RUSS CHEM B, 48(6), 1999, pp. 1100-1103
Citation: Ai. Vilensky et Al. Tolstikhina, Study of pore formation during etching of latent tracks of accelerated heavy ions in poly(ethylene terephthalate) by atomic force microscopy, RUSS CHEM B, 48(6), 1999, pp. 1104-1107
Authors:
Tolstikhina, AL
Arutyunov, PA
Klyshinskii, ES
Citation: Al. Tolstikhina et al., Development of an expert system for interpreting electron diffraction patterns, CRYSTALLO R, 43(6), 1998, pp. 945-949