AAAAAA

   
Results: 1-3 |
Results: 3
The dependence of UMOSFET characteristics and reliability on geometry and processing
Authors: Suliman, SA Gollagunta, N Trabzon, L Hao, J Ridley, RS Knoedler, CM Dolny, GM Awadelkarim, OO Fonash, SJ
Citation: Sa. Suliman et al., The dependence of UMOSFET characteristics and reliability on geometry and processing, SEMIC SCI T, 16(6), 2001, pp. 447-454
Damage to sub-half-micron metal-oxide-silicon field-effect transistors from plasma processing of low-k polymer interlayer dielectrics
Authors: Trabzon, L Awadelkarim, OO
Citation: L. Trabzon et Oo. Awadelkarim, Damage to sub-half-micron metal-oxide-silicon field-effect transistors from plasma processing of low-k polymer interlayer dielectrics, SEMIC SCI T, 15(4), 2000, pp. 309-314
Dependence of the performance and reliability of n-metal-oxide-silicon field effect transistors on interlayer dielectric processing
Authors: Trabzon, L Awadelkarim, OO Werking, J
Citation: L. Trabzon et al., Dependence of the performance and reliability of n-metal-oxide-silicon field effect transistors on interlayer dielectric processing, J VAC SCI B, 17(5), 1999, pp. 2216-2221
Risultati: 1-3 |