Authors: Powell, SG Schwaninger, M Trimble, C

Citation: Sg. Powell et al., Measurement and control of business processes, SYST DYNAM, 17(1), 2001, pp. 63-91

Authors: Bruns, CM Trimble, C

Citation: Cm. Bruns et C. Trimble, Rising tide: Taking our place as young feminist psychologists, WOMEN THER, 23(2), 2001, pp. 19-36

Authors: Zangooie, S Schubert, M Trimble, C Thompson, DW Woollam, JA

Citation: S. Zangooie et al., Infrared ellipsometry characterization of porous silicon Bragg reflectors, APPL OPTICS, 40(6), 2001, pp. 906-912

Authors: DeVries, MJ Trimble, C Tiwald, TE Thompson, DW Woollam, JA Hale, JS

Citation: Mj. Devries et al., Optical constants of crystalline WO3 deposited by magnetron sputtering, J VAC SCI A, 17(5), 1999, pp. 2906-2910

Authors: Trimble, C DeVries, M Hale, JS Thompson, DW Tiwald, TE Woollam, JA

Citation: C. Trimble et al., Infrared emittance modulation devices using electrochromic crystalline tungsten oxide, polymer conductor, and nickel oxide, THIN SOL FI, 356, 1999, pp. 26-34