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Results:
1-15
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Results: 15
Authors:
Troger, L
Kappen, P
Nishino, Y
Haack, N
Materlik, G
Citation: L. Troger et al., Measurements of photon interference X-ray absorption fine structure (pi XAFS), J SYNCHROTR, 8, 2001, pp. 105-109
Authors:
Dubiel, M
Brunsch, S
Troger, L
Citation: M. Dubiel et al., Temperature dependence of thermal expansion coefficient of silver nanoparticles and of bulk material determined by EXAFS, J SYNCHROTR, 8, 2001, pp. 539-541
Authors:
Grunwaldt, JD
Kappen, P
Hammershoi, BS
Troger, L
Clausen, BS
Citation: Jd. Grunwaldt et al., Fluorescence EXAFS for the in situ study on the state of promoters in catalysis, J SYNCHROTR, 8, 2001, pp. 572-574
Authors:
Kappen, P
Troger, L
Hansen, K
Reckleben, C
Lechner, P
Strssuder, L
Materlik, G
Citation: P. Kappen et al., Spatial characterization of monolithic multi-element Silicon-Drift-Detectors for X-ray spectroscopic applications, NUCL INST A, 467, 2001, pp. 1163-1166
Authors:
Owens, A
Bavdaz, M
Peacock, A
Poelaert, A
Andersson, H
Nenonen, S
Troger, L
Bertuccio, G
Citation: A. Owens et al., Hard X-ray spectroscopy using small format GaAs arrays, NUCL INST A, 466(1), 2001, pp. 168-173
Authors:
Nishino, Y
Troger, L
Korecki, R
Materlik, G
Citation: Y. Nishino et al., Photon interference x-ray absorption fine structure - art. no. 201101, PHYS REV B, 6420(20), 2001, pp. 1101
Authors:
Kappen, P
Grunwaldt, JD
Hammershoi, BS
Troger, L
Clausen, BS
Citation: P. Kappen et al., The state of Cu promoter atoms in high-temperature shift catalysts - An insitu fluorescence XAFS study, J CATALYSIS, 198(1), 2001, pp. 56-65
Authors:
Owens, A
Bavdaz, M
Peacock, A
Poelaert, A
Andersson, H
Nenonen, S
Sipila, H
Troger, L
Bertuccio, G
Citation: A. Owens et al., High resolution x-ray spectroscopy using GaAs arrays, J APPL PHYS, 90(10), 2001, pp. 5376-5381
Authors:
Dubiel, M
Brunsch, S
Troger, L
Citation: M. Dubiel et al., Characterization of nanoscale silver particles in glasses by temperature-dependent EXAFS spectroscopy, J PHYS-COND, 12(22), 2000, pp. 4775-4789
Authors:
Klose, F
Rehm, C
Fieber-Erdmann, M
Holub-Krappe, E
Bleif, HJ
Sowers, H
Goyette, R
Troger, L
Maletta, H
Citation: F. Klose et al., Hydrogen absorption in epitaxial W/Nb(001) and polycrystalline Fe/Nb(110) multilayers studied in situ by X-ray/neutron scattering techniques and X-ray absorption spectroscopy, PHYSICA B, 283(1-3), 2000, pp. 184-188
Authors:
Rockenberger, J
zum Felde, U
Tischer, M
Troger, L
Haase, M
Weller, H
Citation: J. Rockenberger et al., Near edge X-ray absorption fine structure measurements (XANES) and extended x-ray absorption fine structure measurements (EXAFS) of the valence stateand coordination of antimony in doped nanocrystalline SnO2, J CHEM PHYS, 112(9), 2000, pp. 4296-4304
Authors:
Hansen, K
Troger, L
Citation: K. Hansen et L. Troger, A novel multicell silicon drift detector module for X-ray spectroscopy andimaging applications, IEEE NUCL S, 47(6), 2000, pp. 2748-2757
Authors:
Tischer, M
Troger, L
Klein, H
Domesle, R
Lox, ES
Prescher, G
Seibold, K
Albers, P
Citation: M. Tischer et al., Geometric and electronic structures of Pt/V2O5/TiO2 diesel engine exhaust gas purification catalysts before and after aging, PCCP PHYS C, 1(11), 1999, pp. 2815-2823
Authors:
Welter, E
Calmano, W
Mangold, S
Troger, L
Citation: E. Welter et al., Chemical speciation of heavy metals in soils by use of XAFS spectroscopy and electron microscopical techniques, FRESEN J AN, 364(3), 1999, pp. 238-244
Authors:
Rockenberger, J
Troger, L
Rogach, AL
Tischer, M
Grundmann, M
Weller, H
Eychmuller, A
Citation: J. Rockenberger et al., An EXAFS study on thiolcapped CdTe nanocrystals, BER BUN GES, 102(11), 1998, pp. 1561-1564
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