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Results:
1-12
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Results: 12
Authors:
Pietrement, O
Troyon, M
Citation: O. Pietrement et M. Troyon, Study of the interfacial shear strength pressure dependence by modulated lateral force microscopy, LANGMUIR, 17(21), 2001, pp. 6540-6546
Authors:
Pietrement, O
Troyon, M
Citation: O. Pietrement et M. Troyon, Quantitative study of shear modulus and interfacial shear strength by combining modulated lateral force and magnetic force modulation microscopies, SURF INT AN, 31(11), 2001, pp. 1060-1067
Authors:
Pietrement, O
Troyon, M
Citation: O. Pietrement et M. Troyon, Study of the interfacial shear strength on carbon fibers surface at the nanometer scale, SURF SCI, 490(1-2), 2001, pp. L592-L596
Authors:
Lei, FH
Shang, GY
Troyon, M
Spajer, M
Morjani, H
Angiboust, JF
Manfait, M
Citation: Fh. Lei et al., Nanospectrofluorometry inside single living cell by scanning near-field optical microscopy, APPL PHYS L, 79(15), 2001, pp. 2489-2491
Authors:
Pastre, D
Bubendorff, JL
Troyon, M
Citation: D. Pastre et al., Resolution in scanning near-field cathodoluminescence microscopy, J VAC SCI B, 18(3), 2000, pp. 1138-1143
Authors:
Bubendorff, JL
Pastre, D
Troyon, M
Citation: Jl. Bubendorff et al., Cathodoluminescence imaging and spectroscopy by near-field detection, J MICROSC O, 199, 2000, pp. 191-196
Authors:
Pietrement, O
Troyon, M
Citation: O. Pietrement et M. Troyon, General equations describing elastic indentation depth and normal contact stiffness versus load, J COLL I SC, 226(1), 2000, pp. 166-171
Authors:
Pastre, D
Troyon, M
Citation: D. Pastre et M. Troyon, Improvement of near-field fluorescence imaging of bulk materials by metal coating, EPJ-APPL PH, 6(2), 1999, pp. 179-188
Authors:
Pietrement, O
Beaudoin, JL
Troyon, M
Citation: O. Pietrement et al., A new calibration method of the lateral contact stiffness and lateral force using modulated lateral force microscopy, TRIBOL LETT, 7(4), 1999, pp. 213-220
Authors:
Faure, J
Pastre, D
Muller, D
Troyon, M
Citation: J. Faure et al., Scanning near-field cathodoluminescence microscopy of an Si+ implanted andthermally annealed SiO2 layer, PHYS LETT A, 255(3), 1999, pp. 187-190
Authors:
Pastre, D
Troyon, M
Duvaut, T
Beaudoin, JL
Citation: D. Pastre et al., Scanning near-field cathodoluminescence microscopy on indented MgO crystal, SURF INT AN, 27(5-6), 1999, pp. 495-498
Authors:
Pastre, D
Troyon, M
Citation: D. Pastre et M. Troyon, Scanning near-field cathodoluminescence microscopy for semiconductor investigations: A theoretical study, J APPL PHYS, 86(8), 1999, pp. 4326-4332
Risultati:
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