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BASKAR K
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Citation: S. Saravanan et al., OPTICAL AND STRUCTURAL QUALITY OF GAAS EPILAYERS FROM GALLIUM, BISMUTH MIXED-SOLVENTS BY LIQUID-PHASE EPITAXY, JPN J A P 1, 37(5A), 1998, pp. 2598-2601
Citation: T. Egawa et al., ALGAAS GAAS LASER-DIODES WITH GAAS ISLANDS ACTIVE REGIONS ON SI GROWNBY DROPLET EPITAXY/, JPN J A P 1, 37(3B), 1998, pp. 1552-1555
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Citation: H. Ishikawa et al., PD GAN SCHOTTKY DIODE WITH A BARRIER HEIGHT OF 1.5 EV AND A REASONABLY EFFECTIVE RICHARDSON COEFFICIENT/, JPN J A P 2, 37(1AB), 1998, pp. 7-9
Citation: G. Wang et al., EFFECTS OF H-PLASMA PASSIVATION ON THE OPTICAL AND ELECTRICAL-PROPERTIES OF GAAS-ON-SI, JPN J A P 2, 37(11A), 1998, pp. 1280-1282
Citation: M. Umeno et al., HETEROEPITAXIAL TECHNOLOGIES ON SI FOR HIGH-EFFICIENCY SOLAR-CELLS, Solar energy materials and solar cells, 50(1-4), 1998, pp. 203-212
Citation: H. Kinoshita et al., SURFACE-REACTION OF A LOW FLUX ATOMIC OXYGEN BEAM WITH A SPIN-COATED POLYIMIDE FILM - TRANSLATIONAL ENERGY-DEPENDENCE ON THE REACTION EFFICIENCY, Transactions of the Japan Society for Aeronautical and Space Sciences, 41(132), 1998, pp. 94-99
Citation: T. Shimura et al., EFFECTS OF THE SUBSTRATE CRYSTALS UPON THE STRUCTURE OF THERMAL OXIDELAYERS ON SI, Crystal research and technology, 33(4), 1998, pp. 637-642
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Citation: H. Kinoshita et al., A FAST ATOMIC OXYGEN BEAM FACILITY WITH IN-SITU TESTING ANALYSIS CAPABILITIES/, Review of scientific instruments, 69(6), 1998, pp. 2273-2277
Authors:
SARAVANAN S
JEGANATHAN K
BASKAR K
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SOGA T
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Citation: S. Saravanan et al., CRYSTAL-GROWTH OF HIGH-QUALITY HYBRID GAAS HETEROEPITAXIAL LAYERS ON SI SUBSTRATE BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION AND LIQUID-PHASE EPITAXY, Journal of crystal growth, 192(1-2), 1998, pp. 23-27
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SHAO CL
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JIMBO T
Citation: Gl. Yu et al., CHARACTERIZATION OF EXCIMER-LASER ANNEALED POLYCRYSTALLINE SI1-XGEX ALLOY THIN-FILMS BY X-RAY-DIFFRACTION AND SPECTROSCOPIC ELLIPSOMETRY, Journal of applied physics, 83(1), 1998, pp. 174-180
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EGAWA T
ISHIKAWA H
JIMBO T
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Citation: S. Arulkumaran et al., INVESTIGATIONS OF SIO2 N-GAN AND SI3N4/N-GAN INSULATOR-SEMICONDUCTOR INTERFACES WITH LOW INTERFACE STATE DENSITY/, Applied physics letters, 73(6), 1998, pp. 809-811
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Citation: G. Yu et al., THE INFRARED OPTICAL FUNCTIONS OF ALXGA1-XN DETERMINED BY REFLECTANCESPECTROSCOPY, Applied physics letters, 73(11), 1998, pp. 1472-1474
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Citation: Gy. Zhao et al., THERMOOPTICAL NONLINEARITY OF GAN GROWN BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Applied physics letters, 73(1), 1998, pp. 22-24
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ISHIKAWA H
UMENO M
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WATANABE J
JIMBO T
SOGA T
Citation: G. Yu et al., OPTICAL-PROPERTIES OF ALXGA1-XN GAN HETEROSTRUCTURES ON SAPPHIRE BY SPECTROSCOPIC ELLIPSOMETRY/, Applied physics letters, 72(18), 1998, pp. 2202-2204
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YU GL
KRISHNA KM
SOGA T
WATANABE JJ
JIMBO T
UMENO M
Citation: M. Mosaddequrrahman et al., DETERMINATION OF OPTICAL-CONSTANTS OF SOLGEL-DERIVED INHOMOGENEOUS TIO2 THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY AND TRANSMISSION SPECTROSCOPY, Applied optics, 37(4), 1998, pp. 691-697