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Results:
1-23
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Results: 23
Authors:
Mizutani, W
Choi, N
Uchihashi, T
Tokumoto, H
Citation: W. Mizutani et al., Carbon nanotube tip for scanning tunneling microscope, JPN J A P 1, 40(6B), 2001, pp. 4328-4330
Authors:
Yura, S
Kiwata, K
Nakano, A
Uchihashi, T
Kanai, A
Citation: S. Yura et al., Service matching and collaboration for electronic commerce, IEICE T INF, E84D(10), 2001, pp. 1294-1301
Authors:
Komiyama, M
Uchihashi, T
Sugawara, Y
Morita, S
Citation: M. Komiyama et al., Molecular orbital interpretation of thymine/graphite nc-AFM images, SURF INT AN, 32(1), 2001, pp. 53-56
Authors:
Umemura, K
Komatsu, J
Uchihashi, T
Choi, N
Ikawa, S
Nishinaka, T
Shibata, T
Nakayama, Y
Katsura, S
Mizuno, A
Tokumoto, H
Ishikawa, M
Kuroda, R
Citation: K. Umemura et al., Atomic force microscopy of RecA-DNA complexes using a carbon nanotube tip, BIOC BIOP R, 281(2), 2001, pp. 390-395
Authors:
Yoshida, H
Sasakura, H
Yabuuchi, T
Takami, T
Uchihashi, T
Kishino, S
Citation: H. Yoshida et al., Back-channel-type scanning charge pumping method for characterization of interface traps in silicon-on-insulator wafer, APPL PHYS L, 79(12), 2001, pp. 1825-1827
Authors:
Ramsperger, U
Uchihashi, T
Nejoh, H
Citation: U. Ramsperger et al., Fabrication and lateral electronic transport measurements of gold nanowires, APPL PHYS L, 78(1), 2001, pp. 85-87
Authors:
Choi, N
Uchihashi, T
Nishijima, H
Ishida, T
Mizutani, W
Akita, S
Nakayama, Y
Ishikawa, M
Tokumoto, H
Citation: N. Choi et al., Atomic force microscopy of single-walled carbon nanotubes using carbon nanotube tip, JPN J A P 1, 39(6B), 2000, pp. 3707-3710
Authors:
Ashino, M
Uchihashi, T
Yokoyama, K
Sugawara, Y
Morita, S
Ishikawa, M
Citation: M. Ashino et al., Structures of an oxygen-deficient TiO2(110) surface studied by noncontact atomic force microscopy, JPN J A P 1, 39(6B), 2000, pp. 3765-3768
Authors:
Uchihashi, T
Choi, N
Tanigawa, M
Ashino, M
Sugawara, Y
Nishijima, H
Akita, S
Nakayama, Y
Tokumoto, H
Yokoyama, K
Morita, S
Ishikawa, M
Citation: T. Uchihashi et al., Carbon-nanotube tip for highly-reproducible imaging of deoxyribonucleic acid helical turns by noncontact atomic force microscopy, JPN J A P 2, 39(8B), 2000, pp. L887-L889
Authors:
Jarvis, SP
Uchihashi, T
Ishida, T
Tokumoto, H
Nakayama, Y
Citation: Sp. Jarvis et al., Local solvation shell measurement in water using a carbon nanotube probe, J PHYS CH B, 104(26), 2000, pp. 6091-6094
Authors:
Morita, S
Sugawara, Y
Yokoyama, K
Uchihashi, T
Citation: S. Morita et al., Correlation of frequency shift discontinuity to atomic positions on a Si(111)7x7 surface by noncontact atomic force microscopy, NANOTECHNOL, 11(2), 2000, pp. 120-123
Authors:
Uchihashi, T
Tanigawa, M
Ashino, M
Sugawara, Y
Yokoyama, K
Morita, S
Ishikawa, M
Citation: T. Uchihashi et al., Identification of B-form DNA in an ultrahigh vacuum by noncontact-mode atomic force microscopy, LANGMUIR, 16(3), 2000, pp. 1349-1353
Authors:
Ashino, M
Uchihashi, T
Yokoyama, K
Sugawara, Y
Morita, S
Ishikawa, M
Citation: M. Ashino et al., Atomic-scale structures on a non-stoichiometric TiO2(110) surface studied by noncontact AFM, APPL SURF S, 157(4), 2000, pp. 212-217
Authors:
Uchihashi, T
Ishida, T
Komiyama, M
Ashino, M
Sugawara, Y
Mizutani, W
Yokoyama, K
Morita, S
Tokumoto, H
Ishikawa, M
Citation: T. Uchihashi et al., High-resolution imaging of organic monolayers using noncontact AFM, APPL SURF S, 157(4), 2000, pp. 244-250
Authors:
Ashino, M
Uchihashi, T
Yokoyama, K
Sugawara, Y
Morita, S
Ishikawa, M
Citation: M. Ashino et al., STM and atomic-resolution noncontact AFM of an oxygen-deficient TiO2(110) surface, PHYS REV B, 61(20), 2000, pp. 13955-13959
Authors:
Yokoyama, K
Ochi, T
Uchihashi, T
Ashino, M
Sugawara, Y
Suehira, N
Morita, S
Citation: K. Yokoyama et al., Optical beam deflection noncontact atomic force microscope optimized with three-dimensional beam adjustment mechanism, REV SCI INS, 71(1), 2000, pp. 128-132
Missing Ag atom on Si(111) root 3 x root 3-Ag surface observed by noncontact atomic force microscopy
Authors:
Morita, S
Sugawara, Y
Orisaka, S
Uchihashi, T
Citation: S. Morita et al., Missing Ag atom on Si(111) root 3 x root 3-Ag surface observed by noncontact atomic force microscopy, JPN J A P 2, 38(11B), 1999, pp. L1342-L1344
Authors:
Orisaka, S
Minobe, T
Uchihashi, T
Sugawara, Y
Morita, S
Citation: S. Orisaka et al., The atomic resolution imaging of metallic Ag(111) surface by noncontact atomic force microscope, APPL SURF S, 140(3-4), 1999, pp. 243-246
Authors:
Minobe, T
Uchihashi, T
Tsukamoto, T
Orisaka, S
Sugawara, Y
Morita, S
Citation: T. Minobe et al., Distance dependence of noncontact-AFM image contrast on Si(111)root 3 X root 3-Ag structure, APPL SURF S, 140(3-4), 1999, pp. 298-303
Authors:
Uchihashi, T
Sugawara, Y
Tsukamoto, T
Minobe, T
Orisaka, S
Okada, T
Morita, S
Citation: T. Uchihashi et al., Imaging of chemical reactivity and buckled dimers on Si(100)2 X 1 reconstructed surface with noncontact AFM, APPL SURF S, 140(3-4), 1999, pp. 304-308
Authors:
Sugawara, Y
Uchihashi, T
Abe, M
Morita, S
Citation: Y. Sugawara et al., True atomic resolution imaging of surface structure and surface charge on the GaAs(110), APPL SURF S, 140(3-4), 1999, pp. 371-375
Authors:
Uchihashi, T
Okada, T
Sugawara, Y
Yokoyama, K
Morita, S
Citation: T. Uchihashi et al., Self-assembled monolayer of adenine base on graphite studied by noncontactatomic force microscopy, PHYS REV B, 60(11), 1999, pp. 8309-8313
Authors:
Sugawara, Y
Minobe, T
Orisaka, S
Uchihashi, T
Tsukamoto, T
Morita, S
Citation: Y. Sugawara et al., Non-contact AFM images measured on Si(111)root 3 x root 3-Ag and Ag(111) surfaces, SURF INT AN, 27(5-6), 1999, pp. 456-461
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