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Results: 1-10 |
Results: 10
NEW APPROACH TO THE CALCULATION OF ELECTRICAL TRANSIENTS, PART-I - THEORY
Authors: BIJL N VANDERSLUIS L
Citation: N. Bijl et L. Vandersluis, NEW APPROACH TO THE CALCULATION OF ELECTRICAL TRANSIENTS, PART-I - THEORY, European transactions on electrical power, 8(3), 1998, pp. 175-179
NEW APPROACH TO THE CALCULATION OF ELECTRICAL TRANSIENTS, PART-II - APPLICATIONS
Authors: BIJL N VANDERSLUIS L
Citation: N. Bijl et L. Vandersluis, NEW APPROACH TO THE CALCULATION OF ELECTRICAL TRANSIENTS, PART-II - APPLICATIONS, European transactions on electrical power, 8(3), 1998, pp. 181-186
A NEW SYNTHETIC TEST CIRCUIT FOR ULTRA-HIGH-VOLTAGE CIRCUIT-BREAKERS
Authors: SHENG BL VANDERSLUIS L
Citation: Bl. Sheng et L. Vandersluis, A NEW SYNTHETIC TEST CIRCUIT FOR ULTRA-HIGH-VOLTAGE CIRCUIT-BREAKERS, IEEE transactions on power delivery, 12(4), 1997, pp. 1514-1519
ADAPTIVE DISTANCE PROTECTION OF DOUBLE-CIRCUIT LINES USING ARTIFICIALNEURAL NETWORKS
Authors: JONGEPIER AG VANDERSLUIS L
Citation: Ag. Jongepier et L. Vandersluis, ADAPTIVE DISTANCE PROTECTION OF DOUBLE-CIRCUIT LINES USING ARTIFICIALNEURAL NETWORKS, IEEE transactions on power delivery, 12(1), 1997, pp. 97-105
COMPARISON OF SYNTHETIC TEST CIRCUITS FOR ULTRA-HIGH-VOLTAGE CIRCUIT-BREAKERS
Authors: SHENG BL VANDERSLUIS L
Citation: Bl. Sheng et L. Vandersluis, COMPARISON OF SYNTHETIC TEST CIRCUITS FOR ULTRA-HIGH-VOLTAGE CIRCUIT-BREAKERS, IEEE transactions on power delivery, 11(4), 1996, pp. 1810-1815
THE INFLUENCE OF THE TOPOLOGY OF TEST CIRCUITS ON THE INTERRUPTING PERFORMANCE OF CIRCUIT-BREAKERS
Authors: SCHAVEMAKER PH VANDERSLUIS L
Citation: Ph. Schavemaker et L. Vandersluis, THE INFLUENCE OF THE TOPOLOGY OF TEST CIRCUITS ON THE INTERRUPTING PERFORMANCE OF CIRCUIT-BREAKERS, IEEE transactions on power delivery, 10(4), 1995, pp. 1822-1828
THE INFLUENCE OF THE ARC VOLTAGE IN SYNTHETIC TEST CIRCUITS
Authors: VANDERSLUIS L SHENG BL
Citation: L. Vandersluis et Bl. Sheng, THE INFLUENCE OF THE ARC VOLTAGE IN SYNTHETIC TEST CIRCUITS, IEEE transactions on power delivery, 10(1), 1995, pp. 274-279
THE COMPARISON OF TEST CIRCUITS WITH ARC MODELS
Authors: VANDERSLUIS L RUTGERS WR
Citation: L. Vandersluis et Wr. Rutgers, THE COMPARISON OF TEST CIRCUITS WITH ARC MODELS, IEEE transactions on power delivery, 10(1), 1995, pp. 280-285
OVERVOLTAGES IN POWER TRANSFORMERS CAUSED BY NO-LOAD SWITCHING
Authors: PAAP GC ALKEMA AA VANDERSLUIS L INDULKAR CS
Citation: Gc. Paap et al., OVERVOLTAGES IN POWER TRANSFORMERS CAUSED BY NO-LOAD SWITCHING, IEEE transactions on power delivery, 10(1), 1995, pp. 301-307
ADAPTIVE DISTANCE PROTECTION OF A DOUBLE-CIRCUIT LINE
Authors: JONGEPIER AG VANDERSLUIS L
Citation: Ag. Jongepier et L. Vandersluis, ADAPTIVE DISTANCE PROTECTION OF A DOUBLE-CIRCUIT LINE, IEEE transactions on power delivery, 9(3), 1994, pp. 1289-1297
Risultati: 1-10 |