Authors: UDAL A VELMRE E

Citation: A. Udal et E. Velmre, SIC-DIODES FORWARD SURGE CURRENT FAILURE MECHANISMS - EXPERIMENT AND SIMULATION, Microelectronics and reliability, 37(10-11), 1997, pp. 1671-1674

Authors: VELMRE E UDAL A KOCSIS T MASSZI F

Citation: E. Velmre et al., A THEORETICALLY ACCURATE MOBILITY MODEL FOR SEMICONDUCTOR-DEVICE DRIFT-DIFFUSION SIMULATION, Physica scripta. T, 54, 1994, pp. 263-267