Authors: ANDRIESH AM MALKOV SA VERLAN VI

Citation: Am. Andriesh et al., ELECTROPHOTOGRAPHIC DEEP-LEVEL SPECTROSCOPY OF AS2SE3 AND AS2S3, Semiconductors, 29(7), 1995, pp. 683-687

Authors: ANDRIESH AM MALKOV SA VERLAN VI

Citation: Am. Andriesh et al., CHARGING AND DISCHARGING CHARACTERISTICS OF MCHDS STRUCTURES, International journal of electronics, 77(6), 1994, pp. 975-980

Authors: ANDRIESH AM AKIMOVA EA BIVOL VV KHANCEVSKAYA EG IOVU MS MALKOV SA VERLAN VI

Citation: Am. Andriesh et al., METAL-SEMICONDUCTOR AMORPHOUS THIN-FILM METAL STRUCTURES - PROPERTIESAND APPLICATIONS, International journal of electronics, 77(3), 1994, pp. 339-342