Authors: LARCIPRETE R GRIMALDI MG BORSELLA E COZZI S MARTELLI S PIERETTI S VIANEY I

Citation: R. Larciprete et al., KRF LASER EPITAXY OF SILICON-GERMANIUM ALLOY LAYERS BY IRRADIATION OFSI(1-X)GEX SI(100) STRUCTURES/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1589-1594

Authors: MARTELLI S VIANEY I LARCIPRETE R BORSELLA E CASTRO J CHIUSSI S LEON B

Citation: S. Martelli et al., X-RAY-DIFFRACTION AND X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF PARTIALLY STRAINED SIGE LAYERS PRODUCED VIA EXCIMER-LASER PROCESSING, Journal of applied physics, 82(1), 1997, pp. 147-154

Authors: HANBUCKEN M VIANEY I PALMINO F PAILHAREY D

Citation: M. Hanbucken et al., CROSS CHARACTERIZATION BY SCANNING ELECTRON-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY OF AG ISLANDS GROWN ON SI(111) 7X7, Microscopy microanalysis microstructures, 5(1), 1994, pp. 41-45

Authors: ROTTGER B HANBUCKEN M VIANEY I KLIESE R NEDDERMEYER H

Citation: B. Rottger et al., SURFACE PERIODICITIES OF HIGH-INDEX FACETS ON VICINAL SI(111), Surface science, 309, 1994, pp. 656-661

Authors: HANBUCKEN M ROTTGER B KLIESE R VIANEY I NEDDERMEYER H

Citation: M. Hanbucken et al., AN STM STUDY OF MECHANOCHEMICALLY PREPARED SI(111) SUBSTRATES - AN EXTENDED SET OF VICINAL SURFACES, Europhysics letters, 23(8), 1993, pp. 573-578

Authors: HANBUCKEN M VIANEY I DEGIOVANNI A JOURDAN C ROTTGER B KLIESE R NEDDERMEYER H

Citation: M. Hanbucken et al., PLAN-VIEW SI(111) SAMPLES FOR SURFACE SCIENCE AND TEM STUDIES, Applied surface science, 72(1), 1993, pp. 79-88