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Results: 1-12 |
Results: 12
ORDERING OF DIBLOCK PS-PBMA THIN-FILMS - AN X-RAY REFLECTIVITY STUDY
Authors: VIGNAUD G GIBAUD A GRUBEL G JOLY S AUSSERRE D LEGRAND JF GALLOT Y
Citation: G. Vignaud et al., ORDERING OF DIBLOCK PS-PBMA THIN-FILMS - AN X-RAY REFLECTIVITY STUDY, Physica. B, Condensed matter, 248, 1998, pp. 250-257
INVESTIGATING LIQUID SURFACES DOWN TO THE NANOMETER-SCALE USING GRAZING-INCIDENCE X-RAY-SCATTERING
Authors: FRADIN C BRASLAU A LUZET D ALBA M GOURIER C DAILLANT J GRUBEL G VIGNAUD G LEGRAND JF LAL J PETIT JM RIEUTORD F
Citation: C. Fradin et al., INVESTIGATING LIQUID SURFACES DOWN TO THE NANOMETER-SCALE USING GRAZING-INCIDENCE X-RAY-SCATTERING, Physica. B, Condensed matter, 248, 1998, pp. 310-315
ANALYSIS OF X-RAY REFLECTIVITY CURVES OF NON-GAUSSIAN SURFACES
Authors: VIGNAUD G GIBAUD A PARIS F AUSSERRE D GRUBEL G
Citation: G. Vignaud et al., ANALYSIS OF X-RAY REFLECTIVITY CURVES OF NON-GAUSSIAN SURFACES, Thin solid films, 323(1-2), 1998, pp. 1-5
AN X-RAY-SCATTERING STUDY OF LATERALLY MODULATED STRUCTURES - THE EXAMPLE OF DIBLOCK COPOLYMERS
Authors: VIGNAUD G GIBAUD A WANG J SINHA SK DAILLANT J GRUBEL G GALLOT Y
Citation: G. Vignaud et al., AN X-RAY-SCATTERING STUDY OF LATERALLY MODULATED STRUCTURES - THE EXAMPLE OF DIBLOCK COPOLYMERS, Journal of physics. Condensed matter, 9(9), 1997, pp. 125-130
BENDING ENERGY OF AMPHIPHILIC FILMS AT THE NANOMETER-SCALE
Authors: GOURIER C DAILLANT J BRASLAU A ALBA M QUINN K LUZET D BLOT C CHATENAY D GRUBEL G LEGRAND JF VIGNAUD G
Citation: C. Gourier et al., BENDING ENERGY OF AMPHIPHILIC FILMS AT THE NANOMETER-SCALE, Physical review letters, 78(16), 1997, pp. 3157-3160
AN X-RAY-SCATTERING STUDY OF LATERALLY MODULATED STRUCTURES - INVESTIGATION OF COHERENCE AND RESOLUTION EFFECTS WITH A GRATING
Authors: GIBAUD A WANG J TOLAN M VIGNAUD G SINHA SK
Citation: A. Gibaud et al., AN X-RAY-SCATTERING STUDY OF LATERALLY MODULATED STRUCTURES - INVESTIGATION OF COHERENCE AND RESOLUTION EFFECTS WITH A GRATING, Journal de physique. I, 6(8), 1996, pp. 1085-1094
CHARACTERIZATION OF INTERFACE ROUGHNESS IN W SI MULTILAYERS BY HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING/
Authors: SALDITT T LOTT D METZGER TH PEISL J VIGNAUD G LEGRAND JF GRUBEL G HOGHOI P SCHARPF O
Citation: T. Salditt et al., CHARACTERIZATION OF INTERFACE ROUGHNESS IN W SI MULTILAYERS BY HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING/, Physica. B, Condensed matter, 221(1-4), 1996, pp. 13-17
OBSERVATION OF THE HUYGENS-PRINCIPLE GROWTH-MECHANISM IN SPUTTERED W SI MULTILAYERS/
Authors: SALDITT T LOTT D METZGER TH PEISL J FISCHER R ZWECK J HOGHOJ P SCHARPF O VIGNAUD G
Citation: T. Salditt et al., OBSERVATION OF THE HUYGENS-PRINCIPLE GROWTH-MECHANISM IN SPUTTERED W SI MULTILAYERS/, Europhysics letters, 36(8), 1996, pp. 565-570
INTERFACIAL ROUGHNESS AND RELATED GROWTH MECHANISMS IN SPUTTERED W SIMULTILAYERS/
Authors: SALDITT T LOTT D METZGER TH PEISL J VIGNAUD G HOGHOJ P SCHARPF O HINZE P LAUER R
Citation: T. Salditt et al., INTERFACIAL ROUGHNESS AND RELATED GROWTH MECHANISMS IN SPUTTERED W SIMULTILAYERS/, Physical review. B, Condensed matter, 54(8), 1996, pp. 5860-5872
HIGH-Q-RESOLUTION X-RAY-DIFFRACTION OF ORDERED FE-AL SINGLE-CRYSTALS
Authors: BLEY F LIVET F LEROUX JC SIMON JP ABERNATHY D ALSNIELSEN J GRUEBEL G VIGNAUD G DOLINO G LEGRAND JF CAMEL D MENGUY N PAPOULAR M
Citation: F. Bley et al., HIGH-Q-RESOLUTION X-RAY-DIFFRACTION OF ORDERED FE-AL SINGLE-CRYSTALS, Acta crystallographica. Section A, Foundations of crystallography, 51, 1995, pp. 746-753
EVIDENCE OF SELF-AFFINE ROUGH INTERFACES IN A LANGMUIR-BLODGETT-FILM FROM X-RAY REFLECTOMETRY
Authors: GIBAUD A COWLAM N VIGNAUD G RICHARDSON T
Citation: A. Gibaud et al., EVIDENCE OF SELF-AFFINE ROUGH INTERFACES IN A LANGMUIR-BLODGETT-FILM FROM X-RAY REFLECTOMETRY, Physical review letters, 74(16), 1995, pp. 3205-3208
THE CORRECTION OF GEOMETRICAL FACTORS IN THE ANALYSIS OF X-RAY REFLECTIVITY
Authors: GIBAUD A VIGNAUD G SINHA SK
Citation: A. Gibaud et al., THE CORRECTION OF GEOMETRICAL FACTORS IN THE ANALYSIS OF X-RAY REFLECTIVITY, Acta crystallographica. Section A, Foundations of crystallography, 49, 1993, pp. 642-648
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