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Results: 1-9 |
Results: 9
PROBLEMS IN SURFACE METROLOGY
Authors: VORBURGER TV DIXSON RG TSAI V DOI T SONG JF RENEGAR TB FU J
Citation: Tv. Vorburger et al., PROBLEMS IN SURFACE METROLOGY, International journal of machine tools & manufacture, 38(5-6), 1998, pp. 417-418
STYLUS FLIGHT IN SURFACE PROFILING
Authors: SONG JF VORBURGER TV
Citation: Jf. Song et Tv. Vorburger, STYLUS FLIGHT IN SURFACE PROFILING, Journal of manufacturing science and engineering, 118(2), 1996, pp. 188-198
STYLUS-LASER SURFACE CALIBRATION SYSTEM
Authors: VORBURGER TV SONG JF GIAUQUE CHW RENEGAR TB WHITENTON EP CROARKIN MC
Citation: Tv. Vorburger et al., STYLUS-LASER SURFACE CALIBRATION SYSTEM, Precision engineering, 19(2-3), 1996, pp. 157-163
MICROFORM CALIBRATION UNCERTAINTIES OF ROCKWELL DIAMOND INDENTERS
Authors: SONG JF RUDDER FF VORBURGER TV SMITH JH
Citation: Jf. Song et al., MICROFORM CALIBRATION UNCERTAINTIES OF ROCKWELL DIAMOND INDENTERS, Journal of research of the National Institute of Standards and Technology, 100(5), 1995, pp. 543-561
MICROFORM CALIBRATIONS IN SURFACE METROLOGY
Authors: SONG JF RUDDER FF VORBURGER TV HARTMAN AW SCACE BR SMITH JH
Citation: Jf. Song et al., MICROFORM CALIBRATIONS IN SURFACE METROLOGY, International journal of machine tools & manufacture, 35(2), 1995, pp. 301-310
LIGHT-SCATTERING BY SINUSOIDAL SURFACES - ILLUMINATION WINDOWS AND HARMONICS IN STANDARDS
Authors: MARX E LETTIERI TR VORBURGER TV
Citation: E. Marx et al., LIGHT-SCATTERING BY SINUSOIDAL SURFACES - ILLUMINATION WINDOWS AND HARMONICS IN STANDARDS, Applied optics, 34(7), 1995, pp. 1269-1277
THE MEASUREMENT AND UNCERTAINTY OF A CALIBRATION STANDARD FOR THE SCANNING ELECTRON-MICROSCOPE
Authors: FU J CROARKIN MC VORBURGER TV
Citation: J. Fu et al., THE MEASUREMENT AND UNCERTAINTY OF A CALIBRATION STANDARD FOR THE SCANNING ELECTRON-MICROSCOPE, Journal of research of the National Institute of Standards and Technology, 99(2), 1994, pp. 191-199
XUV OPTICS CHARACTERIZATION AT THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Authors: WATTS RN TARRIO C LUCATORTO TB MADDEN RP DESLATTES RD CATICHA A ESTLER WT EVANS CJ MCWAID T FU J VORBURGER TV
Citation: Rn. Watts et al., XUV OPTICS CHARACTERIZATION AT THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 79(1-4), 1993, pp. 244-246
REGIMES OF SURFACE-ROUGHNESS MEASURABLE WITH LIGHT-SCATTERING
Authors: VORBURGER TV MARX E LETTIERI TR
Citation: Tv. Vorburger et al., REGIMES OF SURFACE-ROUGHNESS MEASURABLE WITH LIGHT-SCATTERING, Applied optics, 32(19), 1993, pp. 3401-3408
Risultati: 1-9 |