Authors: Vdovenkova, T Vdovenkov, A Soininen, E

Citation: T. Vdovenkova et al., An XPS study of the influence of impurity Cu on the electronic structure of SrS, SURF SCI, 454, 2000, pp. 529-533

Authors: Vdovenkova, T Strikha, V Tsyganova, A

Citation: T. Vdovenkova et al., Silicon nanoparticles characterization by Auger electron spectroscopy, SURF SCI, 454, 2000, pp. 952-956

Authors: Vdovenkova, T Strikha, V Cardon, F Van Meirhaeghe, RL Vanalme, G

Citation: T. Vdovenkova et al., BEEM studies of the PtSi/Si(100) interface electronic structure, J ELEC SPEC, 105(1), 1999, pp. 15-19

Authors: Vdovenkova, T Strikha, V Tsyganova, A

Citation: T. Vdovenkova et al., Application of the final state Auger parameter imperfect screening model for the Si L23VV spectrum of porous silicon, APPL SURF S, 145, 1999, pp. 69-72

Authors: Vdovenkova, T Vdovenkov, A Tornqvist, R

Citation: T. Vdovenkova et al., ZnS wide band gap semiconductor thin film electronic structure sensitivityto Mn impurity, THIN SOL FI, 344, 1999, pp. 332-334