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Results: 1-2 |
Results: 2
Low frequency noise in gate and drain of PHEMT's and related correlation
Authors: Vildeuil, JC Valenza, M Rigaud, D
Citation: Jc. Vildeuil et al., Low frequency noise in gate and drain of PHEMT's and related correlation, MICROEL REL, 40(11), 2000, pp. 1915-1920
Extraction of the BSIM3 1/f noise parameters in CMOS transistors
Authors: Vildeuil, JC Valenza, M Rigaud, D
Citation: Jc. Vildeuil et al., Extraction of the BSIM3 1/f noise parameters in CMOS transistors, MICROELEC J, 30(2), 1999, pp. 199-205
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