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Results: 1-25 | 26-40 |
Results: 26-40/40
A search for fluctuation-dissipation theorem violations in spin-glasses from susceptibility data
Authors: Cugliandolo, LF Grempel, DR Kurchan, J Vincent, E
Citation: Lf. Cugliandolo et al., A search for fluctuation-dissipation theorem violations in spin-glasses from susceptibility data, EUROPH LETT, 48(6), 1999, pp. 699-705
Paleoproductivity in the Equatorial Indian Ocean for the last 260,000 yr: A transfer function based on planktonic foraminifera
Authors: Cayre, O Beaufort, L Vincent, E
Citation: O. Cayre et al., Paleoproductivity in the Equatorial Indian Ocean for the last 260,000 yr: A transfer function based on planktonic foraminifera, QUAT SCI R, 18(6), 1999, pp. 839-857
Emerging oxide degradation mechanisms: Stress induced leakage current (SILC) and quasi-breakdown (QB)
Authors: Ghibaudo, G Riess, P Bruyere, S DeSalvo, B Jahan, C Scarpa, A Pananakakis, G Vincent, E
Citation: G. Ghibaudo et al., Emerging oxide degradation mechanisms: Stress induced leakage current (SILC) and quasi-breakdown (QB), MICROEL ENG, 49(1-2), 1999, pp. 41-50
Turn-around effects during dynamic operation in 0.25 mu m CMOS technology from low to high temperature
Authors: Bravaix, A Goguenheim, D Revil, N Vincent, E
Citation: A. Bravaix et al., Turn-around effects during dynamic operation in 0.25 mu m CMOS technology from low to high temperature, MICROEL ENG, 48(1-4), 1999, pp. 163-166
Membrane topography of the renal phosphate carrier NaPi-2: limited proteolysis studies
Authors: Paquin, J Vincent, E Dugre, A Xiao, YS Boyer, CJC Beliveau, R
Citation: J. Paquin et al., Membrane topography of the renal phosphate carrier NaPi-2: limited proteolysis studies, BBA-PROT ST, 1431(2), 1999, pp. 315-328
Ataxic hemiparesia due to lacunar infarct.
Authors: Besson, G Vincent, E Hommel, M Perret, J
Citation: G. Besson et al., Ataxic hemiparesia due to lacunar infarct., REV NEUROL, 155(3), 1999, pp. 209-212
Magnetic properties of loess grain size fractions from the section at Paks(Hungary)
Authors: Sartori, M Heller, F Forster, T Borkovec, M Hammann, J Vincent, E
Citation: M. Sartori et al., Magnetic properties of loess grain size fractions from the section at Paks(Hungary), PHYS E PLAN, 116(1-4), 1999, pp. 53-64
Extraction of the spin glass correlation length
Authors: Joh, YG Orbach, R Wood, GG Hammann, J Vincent, E
Citation: Yg. Joh et al., Extraction of the spin glass correlation length, PHYS REV L, 82(2), 1999, pp. 438-441
Model for the oxide thickness dependence of SILC generation based on anodehole injection process
Authors: Jahan, C Bruyere, S Ghibaudo, G Vincent, E Barla, K
Citation: C. Jahan et al., Model for the oxide thickness dependence of SILC generation based on anodehole injection process, MICROEL REL, 39(6-7), 1999, pp. 791-795
Temperature acceleration of breakdown and quasi-breakdown phenomena in ultra-thin oxides
Authors: Bruyere, S Roy, D Vincent, E Ghibaudo, G
Citation: S. Bruyere et al., Temperature acceleration of breakdown and quasi-breakdown phenomena in ultra-thin oxides, MICROEL REL, 39(6-7), 1999, pp. 815-820
Accelerated dielectric breakdown and wear out standard testing methods andstructures for reliability evaluation of thin oxides
Authors: Ghibaudo, G Pananakakis, G Kies, R Vincent, E Papadas, C
Citation: G. Ghibaudo et al., Accelerated dielectric breakdown and wear out standard testing methods andstructures for reliability evaluation of thin oxides, MICROEL REL, 39(5), 1999, pp. 597-613
Experiences on reliability simulation in the framework of the PROPHECY project
Authors: Rempp, H Thalau, O Scorzoni, A Ghilbaudo, G Vincent, E Minehane, S
Citation: H. Rempp et al., Experiences on reliability simulation in the framework of the PROPHECY project, MICROEL REL, 39(5), 1999, pp. 661-672
Stress-induced leakage current in very thin dielectric layers: some limitations to reliability extrapolation modeling
Authors: Bruyere, S Vincent, E Ghibaudo, G
Citation: S. Bruyere et al., Stress-induced leakage current in very thin dielectric layers: some limitations to reliability extrapolation modeling, MICROEL REL, 39(2), 1999, pp. 209-214
Analysis of high temperature effects on performances and hot-carrier degradation in DC/AC stressed 0.35 mu m n-MOSFETs
Authors: Bravaix, A Goguenheim, D Revil, N Vincent, E Varrot, M Mortini, P
Citation: A. Bravaix et al., Analysis of high temperature effects on performances and hot-carrier degradation in DC/AC stressed 0.35 mu m n-MOSFETs, MICROEL REL, 39(1), 1999, pp. 35-44
Unified model for breakdown in thin and ultrathin gate oxides (12-5 nm)
Authors: Kamoulakos, G Kelaidis, C Papadas, C Vincent, E Bruyere, S Ghibaudo, G Pananakakis, G Mortini, P Ghidini, G
Citation: G. Kamoulakos et al., Unified model for breakdown in thin and ultrathin gate oxides (12-5 nm), J APPL PHYS, 86(9), 1999, pp. 5131-5140
Risultati: 1-25 | 26-40 |