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Results: 2
Accuracy of measurement of microrelief dimensions from a scanning electronmicroscope image of a cleavage
Authors: Volk, CP Novikov, YA Ozerin, YV Rakov, AV
Citation: Cp. Volk et al., Accuracy of measurement of microrelief dimensions from a scanning electronmicroscope image of a cleavage, MEAS TECH R, 44(4), 2001, pp. 365-369
SEM calibration in the micrometer and submicrometer ranges by means of a periodic linear measure
Authors: Volk, CP Novikov, YA Rakov, AV
Citation: Cp. Volk et al., SEM calibration in the micrometer and submicrometer ranges by means of a periodic linear measure, MEAS TECH R, 43(4), 2000, pp. 346-352
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