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IN-SITU SCANNING-TUNNELING-MICROSCOPY OF HYDROGENATED AMORPHOUS-SILICON AND MICROCRYSTALLINE SILICON
Authors:
FLEWITT AJ
FROGGATT MWD
MILNE WI
STEPHENSON AW
WELLAND ME
Citation: Aj. Flewitt et al., IN-SITU SCANNING-TUNNELING-MICROSCOPY OF HYDROGENATED AMORPHOUS-SILICON AND MICROCRYSTALLINE SILICON, Applied physics A: Materials science & processing, 66, 1998, pp. 1101-1105
Authors:
OSHEA SJ
WELLAND ME
Citation: Sj. Oshea et Me. Welland, ATOMIC-FORCE MICROSCOPY AT SOLID-LIQUID INTERFACES, Langmuir, 14(15), 1998, pp. 4186-4197
Authors:
COWBURN RP
WELLAND ME
Citation: Rp. Cowburn et Me. Welland, MICROMAGNETICS OF THE SINGLE-DOMAIN STATE OF SQUARE FERROMAGNETIC NANOSTRUCTURES, Physical review. B, Condensed matter, 58(14), 1998, pp. 9217-9226
Authors:
DOWNES A
TAYLOR ME
WELLAND ME
Citation: A. Downes et al., 2-SPHERE MODEL OF PHOTON-EMISSION FROM THE SCANNING TUNNELING MICROSCOPE, Physical review. B, Condensed matter, 57(11), 1998, pp. 6706-6714
Authors:
LANTZ MA
OSHEA SJ
WELLAND ME
Citation: Ma. Lantz et al., CHARACTERIZATION OF TIPS FOR CONDUCTING ATOMIC-FORCE MICROSCOPY IN ULTRAHIGH-VACUUM, Review of scientific instruments, 69(4), 1998, pp. 1757-1764
Authors:
DOWNES A
WELLAND ME
Citation: A. Downes et Me. Welland, PHOTON-EMISSION FROM SI(111)-(7X7) INDUCED BY SCANNING-TUNNELING-MICROSCOPY - ATOMIC-SCALE AND MATERIAL CONTRAST, Physical review letters, 81(9), 1998, pp. 1857-1860
Authors:
HERSAM MC
HOOLE ACF
OSHEA SJ
WELLAND ME
Citation: Mc. Hersam et al., POTENTIOMETRY AND REPAIR OF ELECTRICALLY STRESSED NANOWIRES USING ATOMIC-FORCE MICROSCOPY, Applied physics letters, 72(8), 1998, pp. 915-917
Authors:
DOWNES A
WELLAND ME
Citation: A. Downes et Me. Welland, PHOTON-EMISSION FROM AG AND AU CLUSTERS IN THE SCANNING TUNNELING MICROSCOPE, Applied physics letters, 72(21), 1998, pp. 2671-2673
Authors:
DELAMARCHE E
HOOLE ACF
MICHEL B
WILKES S
DESPONT M
WELLAND ME
BIEBUYCK H
Citation: E. Delamarche et al., MAKING GOLD NANOSTRUCTURES USING SELF-ASSEMBLED MONOLAYERS AND A SCANNING TUNNELING MICROSCOPE, JOURNAL OF PHYSICAL CHEMISTRY B, 101(45), 1997, pp. 9263-9269
Authors:
MOULIN AM
STEPHENSON RJ
WELLAND ME
Citation: Am. Moulin et al., MICROMECHANICAL THERMAL SENSORS - COMPARISON OF EXPERIMENTAL RESULTS AND SIMULATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(3), 1997, pp. 590-596
Authors:
MOULIN AM
GASTER M
WOODBURN CN
BARNES JR
WELLAND ME
Citation: Am. Moulin et al., A DIRECTIONALLY SENSITIVE HOT-WIRE ANEMOMETER, Experiments in fluids, 22(6), 1997, pp. 458-462
Authors:
HOOLE ACF
WELLAND ME
BROERS AN
Citation: Acf. Hoole et al., NEGATIVE PMMA AS A HIGH-RESOLUTION RESIST - THE LIMITS AND POSSIBILITIES, Semiconductor science and technology, 12(9), 1997, pp. 1166-1170
Authors:
LANTZ MA
OSHEA SJ
WELLAND ME
Citation: Ma. Lantz et al., SIMULTANEOUS FORCE AND CONDUCTION MEASUREMENTS IN ATOMIC-FORCE MICROSCOPY, Physical review. B, Condensed matter, 56(23), 1997, pp. 15345-15352
Authors:
LANTZ MA
OSHEA SJ
WELLAND ME
JOHNSON KL
Citation: Ma. Lantz et al., ATOMIC-FORCE-MICROSCOPE STUDY OF CONTACT AREA AND FRICTION ON NBSE2, Physical review. B, Condensed matter, 55(16), 1997, pp. 10776-10785
Authors:
KRECMER P
MOULIN AM
STEPHENSON RJ
RAYMENT T
WELLAND ME
ELLIOTT SR
Citation: P. Krecmer et al., REVERSIBLE NANOCONTRACTION AND DILATATION IN A SOLID INDUCED BY POLARIZED-LIGHT, Science, 277(5333), 1997, pp. 1799-1802
Authors:
COWBURN RP
MOULIN AM
WELLAND ME
Citation: Rp. Cowburn et al., HIGH-SENSITIVITY MEASUREMENT OF MAGNETIC-FIELDS USING MICROCANTILEVERS, Applied physics letters, 71(15), 1997, pp. 2202-2204
Authors:
LANTZ MA
OSHEA SJ
HOOLE ACF
WELLAND ME
Citation: Ma. Lantz et al., LATERAL STIFFNESS OF THE TIP AND TIP-SAMPLE CONTACT IN FRICTIONAL FORCE MICROSCOPY, Applied physics letters, 70(8), 1997, pp. 970-972
Authors:
OLTHOFF S
WELLAND ME
Citation: S. Olthoff et Me. Welland, HIGH-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY STUDY OF THE LI SI(111) SURFACE/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1019-1023
Authors:
OSHEA SJ
WELLAND ME
BRUNT TA
RAMADAN AR
RAYMENT T
Citation: Sj. Oshea et al., ATOMIC-FORCE MICROSCOPY STRESS SENSORS FOR STUDIES IN LIQUIDS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1383-1385
Authors:
BRUNT TA
CHABALA ED
RAYMENT T
OSHEA SJ
WELLAND ME
Citation: Ta. Brunt et al., MEASURING SURFACE STRESS-INDUCED BY ELECTRODE PROCESSES USING A MICROMECHANICAL SENSOR, Journal of the Chemical Society. Faraday transactions, 92(20), 1996, pp. 3807-3812
Authors:
BRUNT TA
RAYMENT T
OSHEA SJ
WELLAND ME
Citation: Ta. Brunt et al., MEASURING THE SURFACE STRESSES IN AN ELECTROCHEMICALLY DEPOSITED METAL MONOLAYER - PB ON AU(111), Langmuir, 12(24), 1996, pp. 5942-5946
Authors:
STEPHENSON RJ
OSHEA SJ
BARNES JR
RAYMENT T
WELLAND ME
Citation: Rj. Stephenson et al., A NEAR-FIELD OPTICAL MICROSCOPE WITH NORMAL FORCE DISTANCE REGULATION, Review of scientific instruments, 67(11), 1996, pp. 3891-3897
Authors:
STEPHENSON RJ
WELLAND ME
Citation: Rj. Stephenson et Me. Welland, NORMAL FORCE DISTANCE REGULATION SCHEME FOR NEAR-FIELD OPTICAL MICROSCOPY, Applied physics letters, 68(12), 1996, pp. 1607-1609
Authors:
OSHEA SJ
ATTA RM
MURRELL MP
WELLAND ME
Citation: Sj. Oshea et al., CONDUCTING ATOMIC-FORCE MICROSCOPY STUDY OF SILICON DIOXIDE BREAKDOWN, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(5), 1995, pp. 1945-1952
Authors:
WELLAND ME
GIMZEWSKI JK
Citation: Me. Welland et Jk. Gimzewski, PERSPECTIVES ON THE LIMITS OF FABRICATION AND MEASUREMENT, Philosophical transactions-Royal Society of London. Physical sciences and engineering, 353(1703), 1995, pp. 279-279