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Results:
1-14
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Results: 14
Authors:
SIEGEL J
ETTRICH K
WELSCH E
MATTHIAS E
Citation: J. Siegel et al., UV-LASER ABLATION OF DUCTILE AND BRITTLE METAL-FILMS, Applied physics A: Materials science & processing, 64(2), 1997, pp. 213-218
Authors:
WELSCH E
ETTRICH K
BLASCHKE H
THOMSENSCHMIDT P
SCHAFER D
KAISER N
Citation: E. Welsch et al., INVESTIGATION OF THE ABSORPTION INDUCED DAMAGE IN ULTRAVIOLET DIELECTRIC THIN-FILMS, Optical engineering, 36(2), 1997, pp. 504-514
Authors:
KEMPE M
RUDOLPH W
WELSCH E
Citation: M. Kempe et al., COMPARATIVE-STUDY OF CONFOCAL AND HETERODYNE MICROSCOPY FOR IMAGING THROUGH SCATTERING MEDIA, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(1), 1996, pp. 46-52
Authors:
WELSCH E
ETTRICH K
BLASCHKE H
KAISER N
Citation: E. Welsch et al., EXCIMER-LASER INTERACTION WITH DIELECTRIC THIN-FILMS, Applied surface science, 96-8, 1996, pp. 393-398
Authors:
WELSCH E
RISTAU D
Citation: E. Welsch et D. Ristau, PHOTOTHERMAL MEASUREMENTS ON OPTICAL THIN-FILMS, Applied optics, 34(31), 1995, pp. 7239-7253
Authors:
BODEMANN A
KAISER N
REICHLING M
WELSCH E
Citation: A. Bodemann et al., MICROMETER RESOLVED INSPECTION OF DEFECTS AND LASER DAMAGE SITES IN UV HIGH-REFLECTING COATINGS BY PHOTOTHERMAL DISPLACEMENT MICROSCOPY, Journal de physique. IV, 4(C7), 1994, pp. 611-614
Authors:
ZIMMERMANN P
RISTAU D
WELSCH E
LANGER G
REICHLING M
Citation: P. Zimmermann et al., POTENTIALITY OF THE PHOTOTHERMAL SURFACE DISPLACEMENT TECHNIQUE FOR PRECISELY PERFORMED ABSORPTION MEASUREMENT OF OPTICAL COATINGS, Journal de physique. IV, 4(C7), 1994, pp. 623-626
Authors:
WELSCH E
ETTRICH K
PETERS M
ZIEGLER W
BLASCHKE H
Citation: E. Welsch et al., APPLICATION OF PHOTOTHERMAL PROBE BEAM DEFLECTION TECHNIQUE FOR ABLATION AND DAMAGE MEASUREMENTS BY USING SHORT UV - LASER-PULSES, Journal de physique. IV, 4(C7), 1994, pp. 749-752
Authors:
ZIMMERMANN P
RISTAU D
WELSCH E
Citation: P. Zimmermann et al., POTENTIALITY OF THE PHOTOTHERMAL SURFACE-DISPLACEMENT TECHNIQUE FOR PRECISELY PERFORMED ABSORPTION MEASUREMENT OF OPTICAL COATINGS, Applied physics. A, Solids and surfaces, 58(4), 1994, pp. 377-383
Authors:
REICHLING M
WELSCH E
DUPARRE A
MATTHIAS E
Citation: M. Reichling et al., PHOTOTHERMAL ABSORPTION MICROSCOPY OF DEFECTS IN ZRO2 AND MGF2 SINGLE-LAYER FILMS, Optical engineering, 33(4), 1994, pp. 1334-1342
Authors:
ZIMMERMANN P
WELSCH E
Citation: P. Zimmermann et E. Welsch, MODELING OF SIGNAL-DETECTION BY USING THE PHOTOTHERMAL PROBE BEAM DEFLECTION TECHNIQUE, Review of scientific instruments, 65(1), 1994, pp. 97-101
Authors:
ETTRICH K
WELSCH E
Citation: K. Ettrich et E. Welsch, CALCULATION OF THE PHOTOTHERMAL AND PHOTOACOUSTIC RESPONSE AT THE SAMPLE SURFACE IRRADIATED BY SHORT UV LASER-PULSES, Physica status solidi. a, Applied research, 145(1), 1994, pp. 113-132
Authors:
WELSCH E
REICHLING M
Citation: E. Welsch et M. Reichling, MICROMETER RESOLVED PHOTOTHERMAL DISPLACEMENT INSPECTION OF OPTICAL COATINGS, J. mod. opt., 40(8), 1993, pp. 1455-1475
Authors:
JAUREGUI JA
WELSCH E
Citation: Ja. Jauregui et E. Welsch, TREATMENT OF THERMAL GRATINGS IN THE TIME AND FREQUENCY-DOMAIN, J. mod. opt., 40(11), 1993, pp. 2173-2198
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1-14
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