Citation: Rj. Zieve et al., LOW-TEMPERATURE ELECTRON-PHONON INTERACTION IN SI MOSFETS, Physical review. B, Condensed matter, 57(4), 1998, pp. 2443-2446
Citation: Mr. Deshpande et al., ZEEMAN SPLITTING OF SINGLE SEMICONDUCTOR IMPURITIES IN RESONANT-TUNNELING HETEROSTRUCTURES, Superlattices and microstructures, 20(4), 1996, pp. 513-522
Citation: Mr. Deshpande et al., SPIN SPLITTING OF SINGLE 0D IMPURITY STATES IN SEMICONDUCTOR HETEROSTRUCTURE QUANTUM-WELLS, Physical review letters, 76(8), 1996, pp. 1328-1331
Authors:
MITTAL A
KELLER MW
WHEELER RG
PROBER DE
SACKS RN
Citation: A. Mittal et al., ELECTRON-TEMPERATURE AND THERMAL CONDUCTANCE OF GAAS 2D ELECTRON-GAS SAMPLES BELOW 0.5-K, Physica. B, Condensed matter, 194, 1994, pp. 167-168
Citation: Wr. Anderson et al., DETERMINATION OF SI SIO2 INTERFACE ROUGHNESS USING WEAK-LOCALIZATION/, IEEE electron device letters, 14(7), 1993, pp. 351-353
Authors:
ANDERSON WR
LOMBARDI DR
MITEV PH
MA TP
WHEELER RG
Citation: Wr. Anderson et al., DETERMINATION OF SI SIO2 INTERFACIAL ROUGHNESS USING WEAK-LOCALIZATION/, Microelectronic engineering, 22(1-4), 1993, pp. 43-46