Citation: E. Wirthl et al., DETERMINATION OF AUGER-SENSITIVITY-FACTORS IN ZN1-XMGXTE FOR QUANTITATIVE SURFACE-ANALYSIS, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 400-402
Citation: E. Wirthl et al., MONOCRYSTALLINE (100)-ORIENTED ZNS LAYERS GROWN ON SI BY MOLECULAR-BEAM EPITAXY, Journal of crystal growth, 146(1-4), 1995, pp. 404-407