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Results: 1-25 | 26-50 | 51-59 |
Results: 51-59/59
HARDWARE AND SOFTWARE FOR IN-SITU PROCESS MONITOR AND CONTROL USING MULTIPLE WAVELENGTH ELLIPSOMETRY
Authors: JOHS B DOERR D PITTAL S WOOLLAM JA
Citation: B. Johs et al., HARDWARE AND SOFTWARE FOR IN-SITU PROCESS MONITOR AND CONTROL USING MULTIPLE WAVELENGTH ELLIPSOMETRY, Surface & coatings technology, 62(1-3), 1993, pp. 680-682
CARBON OVERCOATS WITH CONTROLLED PROPERTIES - NONDESTRUCTIVE ELLIPSOMETRY EVALUATION
Authors: MCGAHAN WA MAKOVICKA T HALE J WOOLLAM JA
Citation: Wa. Mcgahan et al., CARBON OVERCOATS WITH CONTROLLED PROPERTIES - NONDESTRUCTIVE ELLIPSOMETRY EVALUATION, Surface & coatings technology, 62(1-3), 1993, pp. 707-710
PHOTOELLIPSOMETRY - A MODULATION SPECTROSCOPY METHOD APPLIED TO N-TYPE GAAS
Authors: XIONG YM SNYDER PG WOOLLAM JA
Citation: Ym. Xiong et al., PHOTOELLIPSOMETRY - A MODULATION SPECTROSCOPY METHOD APPLIED TO N-TYPE GAAS, Thin solid films, 234(1-2), 1993, pp. 399-401
TECHNIQUES FOR ELLIPSOMETRIC MEASUREMENT OF THE THICKNESS AND OPTICAL-CONSTANTS OF THIN ABSORBING FILMS
Authors: MCGAHAN WA JOHS B WOOLLAM JA
Citation: Wa. Mcgahan et al., TECHNIQUES FOR ELLIPSOMETRIC MEASUREMENT OF THE THICKNESS AND OPTICAL-CONSTANTS OF THIN ABSORBING FILMS, Thin solid films, 234(1-2), 1993, pp. 443-446
EX-SITU VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY STUDIES OF ELECTRON-CYCLOTRON-RESONANCE ETCHING OF HG1-XCDXTE
Authors: ORLOFF GJ WOOLLAM JA HE P MCGAHAN WA MCNEIL JR JACOBSON RD JOHS B
Citation: Gj. Orloff et al., EX-SITU VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY STUDIES OF ELECTRON-CYCLOTRON-RESONANCE ETCHING OF HG1-XCDXTE, Thin solid films, 233(1-2), 1993, pp. 46-49
ELECTRON-CYCLOTRON-RESONANCE ETCHING OF SEMICONDUCTOR STRUCTURES STUDIED BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY
Authors: NAFIS S IANNO NJ SYNDER PG MCGAHAN WA JOHS B WOOLLAM JA
Citation: S. Nafis et al., ELECTRON-CYCLOTRON-RESONANCE ETCHING OF SEMICONDUCTOR STRUCTURES STUDIED BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 253-255
LOW-EARTH-ORBIT SIMULATION AND MATERIALS CHARACTERIZATION (VOL 30, PG116, 1993)
Authors: SYNOWICKI RA HALE JS WOOLLAM JA
Citation: Ra. Synowicki et al., LOW-EARTH-ORBIT SIMULATION AND MATERIALS CHARACTERIZATION (VOL 30, PG116, 1993), Journal of spacecraft and rockets, 30(6), 1993, pp. 788-788
NANOSTRUCTURAL EFFECTS AND INTERFACE MAGNETISM IN CO PD MULTILAYERS/
Authors: HE P SHAN ZS WOOLLAM JA SELLMYER DJ
Citation: P. He et al., NANOSTRUCTURAL EFFECTS AND INTERFACE MAGNETISM IN CO PD MULTILAYERS/, Journal of applied physics, 73(10), 1993, pp. 5954-5956
SPECTROSCOPIC ELLIPSOMETRY STUDIES OF HF TREATED SI (100) SURFACES
Authors: YAO H WOOLLAM JA ALTEROVITZ SA
Citation: H. Yao et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES OF HF TREATED SI (100) SURFACES, Applied physics letters, 62(25), 1993, pp. 3324-3326
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