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Authors: WORKMAN GO FOSSUM JG
Citation: Go. Workman et Jg. Fossum, A COMPARATIVE-ANALYSIS OF THE DYNAMIC BEHAVIOR OF BTG SOI MOSFETS ANDCIRCUITS WITH DISTRIBUTED BODY RESISTANCE/, I.E.E.E. transactions on electron devices, 45(10), 1998, pp. 2138-2145

Authors: WORKMAN GO FOSSUM JG KRISHNAN S PELELLA MM
Citation: Go. Workman et al., PHYSICAL MODELING OF TEMPERATURE DEPENDENCES OF SOI CMOS DEVICES AND CIRCUITS INCLUDING SELF-HEATING, I.E.E.E. transactions on electron devices, 45(1), 1998, pp. 125-133
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