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Results: 1-8 |
Results: 8
Scanning Hall probe microscopy on an atomic force microscope tip
Authors: Chong, BK Zhou, H Mills, G Donaldson, L Weaver, JMR
Citation: Bk. Chong et al., Scanning Hall probe microscopy on an atomic force microscope tip, J VAC SCI A, 19(4), 2001, pp. 1769-1772
Lithographically defined nano and micro sensors using "float coating" of resist and electron beam lithography
Authors: Zhou, H Chong, BK Stopford, P Mills, G Midha, A Donaldson, L Weaver, JMR
Citation: H. Zhou et al., Lithographically defined nano and micro sensors using "float coating" of resist and electron beam lithography, J VAC SCI B, 18(6), 2000, pp. 3594-3599
Highly localized thermal, mechanical, and spectroscopic characterization of polymers using miniaturized thermal probes
Authors: Hammiche, A Bozec, L Conroy, M Pollock, HM Mills, G Weaver, JMR Price, DM Reading, M Hourston, DJ Song, M
Citation: A. Hammiche et al., Highly localized thermal, mechanical, and spectroscopic characterization of polymers using miniaturized thermal probes, J VAC SCI B, 18(3), 2000, pp. 1322-1332
Two new microscopical variants of thermomechanical modulation: scanning thermal expansion microscopy and dynamic localized thermomechanical analysis
Authors: Hammiche, A Price, DM Dupas, E Mills, G Kulik, A Reading, M Weaver, JMR Pollock, HM
Citation: A. Hammiche et al., Two new microscopical variants of thermomechanical modulation: scanning thermal expansion microscopy and dynamic localized thermomechanical analysis, J MICROSC O, 199, 2000, pp. 180-190
Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography
Authors: Zhou, H Midha, A Bruchhaus, L Mills, G Donaldson, L Weaver, JMR
Citation: H. Zhou et al., Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography, J VAC SCI B, 17(5), 1999, pp. 1954-1958
Recent progress in the functionalization of atomic force microscope probesusing electron-beam nanolithography
Authors: Zhou, H Mills, G Chong, BK Midha, A Donaldson, L Weaver, JMR
Citation: H. Zhou et al., Recent progress in the functionalization of atomic force microscope probesusing electron-beam nanolithography, J VAC SCI A, 17(4), 1999, pp. 2233-2239
Detection of subsurface voids using scanning thermal microscopy
Authors: Mills, G Weaver, JMR Harris, G Chen, W Carrejo, J Johnson, L Rogers, B
Citation: G. Mills et al., Detection of subsurface voids using scanning thermal microscopy, ULTRAMICROS, 80(1), 1999, pp. 7-11
Scanning near-field optical spectroscopy and imaging using nanofabricated probes
Authors: Zhou, H Midha, A Mills, G Donaldson, L Weaver, JMR
Citation: H. Zhou et al., Scanning near-field optical spectroscopy and imaging using nanofabricated probes, APPL PHYS L, 75(13), 1999, pp. 1824-1826
Risultati: 1-8 |