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Results: 1-21 |
Results: 21
Characterisation of compact discs using time of flight-energy elastic recoil detection analysis
Authors: Zhang, YW Possnert, G Jonsson, L Winzell, T Whitlow, HJ
Citation: Yw. Zhang et al., Characterisation of compact discs using time of flight-energy elastic recoil detection analysis, JPN J A P 1, 40(2A), 2001, pp. 629-633
Bandgap modification in GaInAs/InP quantum well structures using switched ion channelling lithography
Authors: Winzell, T Maximov, I Landin, L Zhang, Y Gustafsson, A Samuelson, L Whitlow, HJ
Citation: T. Winzell et al., Bandgap modification in GaInAs/InP quantum well structures using switched ion channelling lithography, SEMIC SCI T, 16(11), 2001, pp. 889-894
Measurements of the mean energy-loss of swift heavy ions in carbon with high precision
Authors: Zhang, YW Possnert, G Whitlow, HJ
Citation: Yw. Zhang et al., Measurements of the mean energy-loss of swift heavy ions in carbon with high precision, NUCL INST B, 183(1-2), 2001, pp. 34-47
Separation of mass-overlapped time of flight-energy elastic recoil detection analysis data using Ryan and Jamieson's dynamic analysis method
Authors: Persson, L Whitlow, HJ El Bouanani, M Hult, M Andersson, M Bubb, IF Cohen, DD Dytlewski, N Johnston, PN Walker, SR Zaring, C Ostling, M
Citation: L. Persson et al., Separation of mass-overlapped time of flight-energy elastic recoil detection analysis data using Ryan and Jamieson's dynamic analysis method, NUCL INST B, 179(3), 2001, pp. 403-411
Scanning mu-RBS characterisation of local loading effects of non-selectively epitaxially grown SiGe thin films
Authors: Winzell, T Pejnefors, J Elfman, M Ostling, M Whitlow, HJ
Citation: T. Winzell et al., Scanning mu-RBS characterisation of local loading effects of non-selectively epitaxially grown SiGe thin films, NUCL INST B, 179(1), 2001, pp. 121-125
Annealing behaviour of foreign atom incorporated Co-silicides formed by MEVVA implantation into SiO2/Si and Si3N4/Si structures
Authors: Zhang, YW Zhang, TH Lu, DT Maximov, IA Sarwe, EL Graczyk, M Whitlow, HJ
Citation: Yw. Zhang et al., Annealing behaviour of foreign atom incorporated Co-silicides formed by MEVVA implantation into SiO2/Si and Si3N4/Si structures, NUCL INST B, 175, 2001, pp. 737-743
Sputtering transients for some transition elements during high-fluence MEVVA implantation of Si
Authors: Zhang, YW Zhang, TH Xiao, ZS Whitlow, HJ
Citation: Yw. Zhang et al., Sputtering transients for some transition elements during high-fluence MEVVA implantation of Si, NUCL INST B, 173(4), 2001, pp. 427-435
Scanning probe microscopy characterisation of masked low energy implanted nanometer structures
Authors: Winzell, T Anand, S Maximov, I Sarwe, EL Graczyk, M Montelius, L Whitlow, HJ
Citation: T. Winzell et al., Scanning probe microscopy characterisation of masked low energy implanted nanometer structures, NUCL INST B, 173(4), 2001, pp. 447-454
Pion production excitation functions in proton-nucleus collisions from theabsolute threshold to 500 MeV - art. no. 014610
Authors: Martensson, J Berg, M Carlen, L Elmer, R Fokin, A Ghetti, R Jakobsson, B Noren, B Oskarsson, A Whitlow, HJ Ekstrom, C Ericsson, G Romanski, J van Veldhuizen, EJ Westerberg, L Julien, J Nybo, K Thorsteinsen, TF Amirelmi, S Guttormsen, M Lovhoiden, G Bellini, V Palazzolo, F Sperduto, ML Sutera, C Avdeichikov, V Kuznetsov, A Murin, Y
Citation: J. Martensson et al., Pion production excitation functions in proton-nucleus collisions from theabsolute threshold to 500 MeV - art. no. 014610, PHYS REV C, 6201(1), 2000, pp. 4610
A compact Ultra-High Vacuum (UHV) compatible instrument for time of flight-energy measurements of slow heavy reaction products
Authors: Kuznetsov, AV van Veldhuizen, EJ Westerberg, L Lyapin, VG Aleklett, K Loveland, W Bondorf, J Jakobsson, B Whitlow, HJ El Bouanani, M
Citation: Av. Kuznetsov et al., A compact Ultra-High Vacuum (UHV) compatible instrument for time of flight-energy measurements of slow heavy reaction products, NUCL INST A, 452(3), 2000, pp. 525-532
Correlation of energy-loss and collected-charge in Si Delta E detectors: Measurements using an Enge spectrometer
Authors: Whitlow, HJ Zhang, YW Timmers, H Ophel, TR Elliman, RG Li, MM O'Connor, DJ
Citation: Hj. Whitlow et al., Correlation of energy-loss and collected-charge in Si Delta E detectors: Measurements using an Enge spectrometer, NUCL INST B, 164, 2000, pp. 186-190
Application specific integrated circuit (ASIC) readout technologies for future ion beam analytical instruments
Authors: Whitlow, HJ
Citation: Hj. Whitlow, Application specific integrated circuit (ASIC) readout technologies for future ion beam analytical instruments, NUCL INST B, 161, 2000, pp. 281-286
Influence of heavy ion irradiation damage on silicon charged particle detector calibration
Authors: Zhang, YW Whitlow, HJ Winzell, T
Citation: Yw. Zhang et al., Influence of heavy ion irradiation damage on silicon charged particle detector calibration, NUCL INST B, 161, 2000, pp. 297-301
Analysis of ferromagnetic removable hard disc media ageing by time of flight-energy elastic recoil detection analysis
Authors: Winzell, T Zhang, YW Whitlow, HJ
Citation: T. Winzell et al., Analysis of ferromagnetic removable hard disc media ageing by time of flight-energy elastic recoil detection analysis, NUCL INST B, 161, 2000, pp. 558-562
Studies of electrochemical oxidation of Zircaloy nuclear reactor fuel cladding using time-of-flight-energy elastic recoil detection analysis
Authors: Whitlow, HJ Zhang, Y Wang, Y Winzell, T Simic, N Ahlberg, E Limback, M Wikmark, G
Citation: Hj. Whitlow et al., Studies of electrochemical oxidation of Zircaloy nuclear reactor fuel cladding using time-of-flight-energy elastic recoil detection analysis, NUCL INST B, 161, 2000, pp. 584-589
High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part II: sputtering yield transients, the approach to high-fluence equilibrium
Authors: Zhang, YW Winzell, T Zhang, TH Maximov, IA Sarwe, EL Graczyk, M Montelius, L Whitlow, HJ
Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part II: sputtering yield transients, the approach to high-fluence equilibrium, NUCL INST B, 159(3), 1999, pp. 133-141
High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part I: formationof thin silicide surface films
Authors: Zhang, YW Winzell, T Zhang, TH Andersson, M Maximov, IA Sarwe, EL Graczyk, M Montelius, L Whitlow, HJ
Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part I: formationof thin silicide surface films, NUCL INST B, 159(3), 1999, pp. 142-157
High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part III: heavy-fluence Co bombardment induced surface topography development
Authors: Zhang, YW Winzell, T Zhang, TH Maximov, IA Sarwe, EL Graczyk, M Montelius, L Whitlow, HJ
Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part III: heavy-fluence Co bombardment induced surface topography development, NUCL INST B, 159(3), 1999, pp. 158-165
The response and calibration of thin Si Delta E detectors
Authors: Zhang, YW Winzell, T Whitlow, HJ
Citation: Yw. Zhang et al., The response and calibration of thin Si Delta E detectors, NUCL INST B, 159(1-2), 1999, pp. 101-110
Characterisation of ferromagnetic magnetic storage media surfaces by complementary particle induced X-ray analysis and time of flight-energy dispersive elastic recoil detection analysis
Authors: Zhang, YW Elfman, M Winzell, T Whitlow, HJ
Citation: Yw. Zhang et al., Characterisation of ferromagnetic magnetic storage media surfaces by complementary particle induced X-ray analysis and time of flight-energy dispersive elastic recoil detection analysis, NUCL INST B, 150(1-4), 1999, pp. 548-553
Detection efficiency of time-of-flight energy elastic recoil detection analysis systems
Authors: Zhang, YW Whitlow, HJ Winzell, T Bubb, IF Sajavaara, T Arstila, K Keinonen, J
Citation: Yw. Zhang et al., Detection efficiency of time-of-flight energy elastic recoil detection analysis systems, NUCL INST B, 149(4), 1999, pp. 477-489
Risultati: 1-21 |