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Results:
1-5
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Results: 5
Strength of the electric field in apertureless near-field optical microscopy
Authors:
Martin, YC Hamann, HF Wickramasinghe, HK
Citation:
Yc. Martin et al., Strength of the electric field in apertureless near-field optical microscopy, J APPL PHYS, 89(10), 2001, pp. 5774-5778
Progress in scanning probe microscopy
Authors:
Wickramasinghe, HK
Citation:
Hk. Wickramasinghe, Progress in scanning probe microscopy, ACT MATER, 48(1), 2000, pp. 347-358
Thermal proximity imaging of hard-disk substrates
Authors:
Abraham, DW Chainer, TJ Etzold, KF Wickramasinghe, HK
Citation:
Dw. Abraham et al., Thermal proximity imaging of hard-disk substrates, IEEE MAGNET, 36(6), 2000, pp. 3997-4004
Measurement of trench depth by infrared interferometry
Authors:
van Kessel, T Wickramasinghe, HK
Citation:
T. Van Kessel et Hk. Wickramasinghe, Measurement of trench depth by infrared interferometry, OPTICS LETT, 24(23), 1999, pp. 1702-1704
Atomic force microscopy of work functions on the nanometer scale
Authors:
O'Boyle, MP Hwang, TT Wickramasinghe, HK
Citation:
Mp. O'Boyle et al., Atomic force microscopy of work functions on the nanometer scale, APPL PHYS L, 74(18), 1999, pp. 2641-2642
Risultati:
1-5
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