Authors: Martin, YC Hamann, HF Wickramasinghe, HK

Citation: Yc. Martin et al., Strength of the electric field in apertureless near-field optical microscopy, J APPL PHYS, 89(10), 2001, pp. 5774-5778

Authors: Wickramasinghe, HK

Citation: Hk. Wickramasinghe, Progress in scanning probe microscopy, ACT MATER, 48(1), 2000, pp. 347-358

Authors: Abraham, DW Chainer, TJ Etzold, KF Wickramasinghe, HK

Citation: Dw. Abraham et al., Thermal proximity imaging of hard-disk substrates, IEEE MAGNET, 36(6), 2000, pp. 3997-4004

Authors: van Kessel, T Wickramasinghe, HK

Citation: T. Van Kessel et Hk. Wickramasinghe, Measurement of trench depth by infrared interferometry, OPTICS LETT, 24(23), 1999, pp. 1702-1704

Authors: O'Boyle, MP Hwang, TT Wickramasinghe, HK

Citation: Mp. O'Boyle et al., Atomic force microscopy of work functions on the nanometer scale, APPL PHYS L, 74(18), 1999, pp. 2641-2642