Authors:
Zhang, YW
Possnert, G
Jonsson, L
Winzell, T
Whitlow, HJ
Citation: Yw. Zhang et al., Characterisation of compact discs using time of flight-energy elastic recoil detection analysis, JPN J A P 1, 40(2A), 2001, pp. 629-633
Authors:
Winzell, T
Maximov, I
Landin, L
Zhang, Y
Gustafsson, A
Samuelson, L
Whitlow, HJ
Citation: T. Winzell et al., Bandgap modification in GaInAs/InP quantum well structures using switched ion channelling lithography, SEMIC SCI T, 16(11), 2001, pp. 889-894
Authors:
Winzell, T
Pejnefors, J
Elfman, M
Ostling, M
Whitlow, HJ
Citation: T. Winzell et al., Scanning mu-RBS characterisation of local loading effects of non-selectively epitaxially grown SiGe thin films, NUCL INST B, 179(1), 2001, pp. 121-125
Authors:
Winzell, T
Anand, S
Maximov, I
Sarwe, EL
Graczyk, M
Montelius, L
Whitlow, HJ
Citation: T. Winzell et al., Scanning probe microscopy characterisation of masked low energy implanted nanometer structures, NUCL INST B, 173(4), 2001, pp. 447-454
Citation: Yw. Zhang et al., Influence of heavy ion irradiation damage on silicon charged particle detector calibration, NUCL INST B, 161, 2000, pp. 297-301
Citation: T. Winzell et al., Analysis of ferromagnetic removable hard disc media ageing by time of flight-energy elastic recoil detection analysis, NUCL INST B, 161, 2000, pp. 558-562
Authors:
Zhang, YW
Winzell, T
Zhang, TH
Maximov, IA
Sarwe, EL
Graczyk, M
Montelius, L
Whitlow, HJ
Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part II: sputtering yield transients, the approach to high-fluence equilibrium, NUCL INST B, 159(3), 1999, pp. 133-141
Authors:
Zhang, YW
Winzell, T
Zhang, TH
Andersson, M
Maximov, IA
Sarwe, EL
Graczyk, M
Montelius, L
Whitlow, HJ
Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part I: formationof thin silicide surface films, NUCL INST B, 159(3), 1999, pp. 142-157
Authors:
Zhang, YW
Winzell, T
Zhang, TH
Maximov, IA
Sarwe, EL
Graczyk, M
Montelius, L
Whitlow, HJ
Citation: Yw. Zhang et al., High-fluence Co implantation in Si, SiO2/Si and Si3N4/Si Part III: heavy-fluence Co bombardment induced surface topography development, NUCL INST B, 159(3), 1999, pp. 158-165
Authors:
Zhang, YW
Elfman, M
Winzell, T
Whitlow, HJ
Citation: Yw. Zhang et al., Characterisation of ferromagnetic magnetic storage media surfaces by complementary particle induced X-ray analysis and time of flight-energy dispersive elastic recoil detection analysis, NUCL INST B, 150(1-4), 1999, pp. 548-553