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Results: 1-11 |
Results: 11

Authors: Wu, WF Ni, CC Liou, HY
Citation: Wf. Wu et al., Random outcome and stochastic analysis of some fatigue crack growth data, CH J MECH-A, 17(2), 2001, pp. 61-68

Authors: Yang, WL Wu, WF Liu, DG Wu, CC Ou, KL
Citation: Wl. Yang et al., Barrier capability of TaNx films deposited by different nitrogen flow rateagainst Cu diffusion in Cu/TaNx/n(+)-p junction diodes, SOL ST ELEC, 45(1), 2001, pp. 149-158

Authors: Chin, YL Chiou, BS Wu, WF
Citation: Yl. Chin et al., Effect of aluminum seed layer on the crystallographic texture and electromigration resistance of physical vapor deposited copper interconnect, JPN J A P 1, 39(12A), 2000, pp. 6708-6715

Authors: Wu, WF Cheng, HC Kang, CK
Citation: Wf. Wu et al., Random field formulation of composite laminates, COMP STRUCT, 49(1), 2000, pp. 87-93

Authors: Wu, WF Lin, CC Huang, CC Lin, HC Chang, TC Yang, RP Huang, TY
Citation: Wf. Wu et al., Highly (111) textured titanium nitride layers for sub- quarter-micrometer Al metallization, EL SOLID ST, 2(7), 1999, pp. 342-344

Authors: Yew, JY Chen, LJ Wu, WF
Citation: Jy. Yew et al., Formation and growth of CoSi2 on (001)Si inside 0.2-2 mu m oxide openings prepared by electron-beam lithography, J VAC SCI B, 17(3), 1999, pp. 939-944

Authors: Lee, WS Ma, RH Wu, WF Chen, SL
Citation: Ws. Lee et al., Performance and bearing load analysis of a twin screw air compressor, CH J MECH-A, 15(2), 1999, pp. 69-78

Authors: Liou, HY Wu, WF Shin, CS
Citation: Hy. Liou et al., A modified model for the estimation of fatigue life derived from random vibration theory, PROB ENG M, 14(3), 1999, pp. 281-288

Authors: Yew, JY Chen, LJ Wu, WF
Citation: Jy. Yew et al., Effects of lateral confinement on the growth of CoSi and CoSi2 on (001)Si inside 0.2-2 mu m oxide openings prepared by electron beam lithography, MATER CH PH, 61(1), 1999, pp. 42-45

Authors: Wu, WF Zhou, YN Gottesman, S
Citation: Wf. Wu et al., Redundant in vivo proteolytic activities of Escherichia coli lon and the ClpYQ (HslUV) protease, J BACT, 181(12), 1999, pp. 3681-3687

Authors: Yang, WL Wu, WF Liu, DG Hung, TC Tseng, FY
Citation: Wl. Yang et al., Improving thermal stability of shallow junctions by N-2(+) pre-implantation, ELECTR LETT, 35(24), 1999, pp. 2143-2145
Risultati: 1-11 |