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Results: 1-9 |
Results: 9
CHARACTERISTICS OF HYDROGENATED ALUMINUM NITRIDE FILMS PREPARED BY RADIO-FREQUENCY REACTIVE SPUTTERING AND THEIR APPLICATION TO SURFACE-ACOUSTIC-WAVE DEVICES
Authors: YONG YJ LEE JY
Citation: Yj. Yong et Jy. Lee, CHARACTERISTICS OF HYDROGENATED ALUMINUM NITRIDE FILMS PREPARED BY RADIO-FREQUENCY REACTIVE SPUTTERING AND THEIR APPLICATION TO SURFACE-ACOUSTIC-WAVE DEVICES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(2), 1997, pp. 390-393
A STUDY OF THE GROWTH-MECHANISM OF NI2SI PHASE FORMED AT NI A-SI INTERFACE/
Authors: KIM HS YONG YJ LEE JY LEE KY
Citation: Hs. Kim et al., A STUDY OF THE GROWTH-MECHANISM OF NI2SI PHASE FORMED AT NI A-SI INTERFACE/, Journal of materials science letters, 16(7), 1997, pp. 560-562
HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY ON THE MICROSTRUCTURES OF ALUMINUM NITRIDE AND HYDROGENATED ALUMINUM NITRIDE FILMS PREPARED BY RADIO-FREQUENCY REACTIVE SPUTTERING
Authors: YONG YJ LEE JY KIM HS LEE JY
Citation: Yj. Yong et al., HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY ON THE MICROSTRUCTURES OF ALUMINUM NITRIDE AND HYDROGENATED ALUMINUM NITRIDE FILMS PREPARED BY RADIO-FREQUENCY REACTIVE SPUTTERING, Applied physics letters, 71(11), 1997, pp. 1489-1491
SUBSTANTIAL DIFFUSION OF ZR DURING SOLID-STATE AMORPHIZATION IN NI ZRMULTILAYERS/
Authors: CHANG SG LEE KY YONG YJ LEE JY KIM GH CHUN CH
Citation: Sg. Chang et al., SUBSTANTIAL DIFFUSION OF ZR DURING SOLID-STATE AMORPHIZATION IN NI ZRMULTILAYERS/, Journal of materials science. Materials in electronics, 7(1), 1996, pp. 47-50
EFFECT OF HYDROGEN ADDITION ON THE PREFERRED ORIENTATION OF ALN FILMSPREPARED BY REACTIVE SPUTTERING
Authors: LEE HC LEE KY YONG YJ LEE JY KIM GH
Citation: Hc. Lee et al., EFFECT OF HYDROGEN ADDITION ON THE PREFERRED ORIENTATION OF ALN FILMSPREPARED BY REACTIVE SPUTTERING, Thin solid films, 271(1-2), 1995, pp. 50-55
INFLUENCE OF SPUTTERING PRESSURE ON THE MICROSTRUCTURE EVOLUTION OF AIN THIN-FILMS PREPARED BY REACTIVE SPUTTERING
Authors: LEE HC KIM GH HONG SK LEE KY YONG YJ CHUN CH LEE JY
Citation: Hc. Lee et al., INFLUENCE OF SPUTTERING PRESSURE ON THE MICROSTRUCTURE EVOLUTION OF AIN THIN-FILMS PREPARED BY REACTIVE SPUTTERING, Thin solid films, 261(1-2), 1995, pp. 148-153
INFLUENCES OF DEPOSITION PARAMETERS ON THE CRYSTALLOGRAPHIC ORIENTATION OF REACTIVELY SPUTTERED ALUMINUM NITRIDE THIN-FILMS
Authors: LEE HC YONG YJ LEE JY
Citation: Hc. Lee et al., INFLUENCES OF DEPOSITION PARAMETERS ON THE CRYSTALLOGRAPHIC ORIENTATION OF REACTIVELY SPUTTERED ALUMINUM NITRIDE THIN-FILMS, European journal of solid state and inorganic chemistry, 31(6), 1994, pp. 513-523
EFFECT OF TRANSITION ELEMENT SUBSTITUTION ON THE AMORPHIZATION TEMPERATURE IN THE ERCO2 C15 LAVES COMPOUND
Authors: YONG YJ LEE JY
Citation: Yj. Yong et Jy. Lee, EFFECT OF TRANSITION ELEMENT SUBSTITUTION ON THE AMORPHIZATION TEMPERATURE IN THE ERCO2 C15 LAVES COMPOUND, Journal of alloys and compounds, 209, 1994, pp. 120000005-120000008
FORMATION OF THE AMORPHOUS PHASE IN ERCO(2) C15 LAVES COMPOUNDS BY HYDROGEN ABSORPTION
Authors: YONG YJ LEE JY
Citation: Yj. Yong et Jy. Lee, FORMATION OF THE AMORPHOUS PHASE IN ERCO(2) C15 LAVES COMPOUNDS BY HYDROGEN ABSORPTION, Journal of non-crystalline solids, 169(1-2), 1994, pp. 96-103
Risultati: 1-9 |