ACNP - Italian Periodicals Catalogue

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Results: 10

MICROSTRUCTURE STUDY OF NONEPITAXIAL CAF2 THIN-FILMS GROWN ON SI BY TRANSMISSION ELECTRON-MICROSCOPY

Authors: YUZHANG K LEPRINCEWANG Y

Citation: K. Yuzhang et Y. Leprincewang, MICROSTRUCTURE STUDY OF NONEPITAXIAL CAF2 THIN-FILMS GROWN ON SI BY TRANSMISSION ELECTRON-MICROSCOPY, Materials chemistry and physics, 52(1), 1998, pp. 66-70

STRUCTURAL AND MAGNETOTRANSPORT PROPERTIES OF ELECTRODEPOSITED BISMUTH NANOWIRES (VOL 73, 1436, 1998)

Authors: LIU KI CHIEN CL SEARSON PC YUZHANG K

Citation: Ki. Liu et al., STRUCTURAL AND MAGNETOTRANSPORT PROPERTIES OF ELECTRODEPOSITED BISMUTH NANOWIRES (VOL 73, 1436, 1998), Applied physics letters, 73(15), 1998, pp. 2222-2222

CORRELATION BETWEEN MICROSTRUCTURE AND THE OPTICAL-PROPERTIES OF TIO2THIN-FILMS PREPARED ON DIFFERENT SUBSTRATES

Authors: LEPRINCEWANG Y YUZHANG K VAN VN SOUCHE D RIVORY J

Citation: Y. Leprincewang et al., CORRELATION BETWEEN MICROSTRUCTURE AND THE OPTICAL-PROPERTIES OF TIO2THIN-FILMS PREPARED ON DIFFERENT SUBSTRATES, Thin solid films, 307(1-2), 1997, pp. 38-42

DEPOSITION OF TA2O5 SIO2 MULTILAYER FILMS BY A NEW PROCESS INJECTION MOCVD/

Authors: FELTEN F SENATEUR JP LABEAU M YUZHANG K ABRUTIS A

Citation: F. Felten et al., DEPOSITION OF TA2O5 SIO2 MULTILAYER FILMS BY A NEW PROCESS INJECTION MOCVD/, Thin solid films, 296(1-2), 1997, pp. 79-81

SPATIALLY-RESOLVED EELS FINE-STRUCTURES AT A SIO2 TIO2 INTERFACE/

Authors: BRUN N COLLIEX C RIVORY J YUZHANG K

Citation: N. Brun et al., SPATIALLY-RESOLVED EELS FINE-STRUCTURES AT A SIO2 TIO2 INTERFACE/, Microscopy microanalysis microstructures, 7(3), 1996, pp. 161-174

TEM STUDY OF ELECTRODEPOSITED NI CU MULTILAYERS IN THE FORM OF NANOWIRES/

Authors: WANG L YUZHANG K METROT A BONHOMME P TROYON M

Citation: L. Wang et al., TEM STUDY OF ELECTRODEPOSITED NI CU MULTILAYERS IN THE FORM OF NANOWIRES/, Thin solid films, 288(1-2), 1996, pp. 86-89

GROWTH-MECHANISM AND STRUCTURE OF ELECTRODEPOSITED CU NI MULTILAYERS/

Authors: WANG L FRICOTEAUX P YUZHANG K TROYON M BONHOMME P DOUGLADE J METROT A

Citation: L. Wang et al., GROWTH-MECHANISM AND STRUCTURE OF ELECTRODEPOSITED CU NI MULTILAYERS/, Thin solid films, 261(1-2), 1995, pp. 160-167

X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE GROWTH OF DIELECTRIC FILMS ON VARIOUS SUBSTRATES

Authors: WANG Y FISSON S VAN VN VUYE G YUZHANG K RIVORY J

Citation: Y. Wang et al., X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE GROWTH OF DIELECTRIC FILMS ON VARIOUS SUBSTRATES, Surface & coatings technology, 68, 1994, pp. 724-728

CHARACTERIZATION OF TIO2 SIO2 MULTILAYERS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY AND ELECTRON-ENERGY-LOSS SPECTROSCOPY/

Authors: YUZHANG K BOISJOLLY G RIVORY J KILIAN L COLLIEX C

Citation: K. Yuzhang et al., CHARACTERIZATION OF TIO2 SIO2 MULTILAYERS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY AND ELECTRON-ENERGY-LOSS SPECTROSCOPY/, Thin solid films, 253(1-2), 1994, pp. 299-302

STUDY OF CAF2 GROWTH ON SI, A-SIO2 BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY

Authors: RIVORY J FISSON S VAN VN VUYE G WANG Y ABELES F YUZHANG K

Citation: J. Rivory et al., STUDY OF CAF2 GROWTH ON SI, A-SIO2 BY IN-SITU SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 260-263

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