Citation: M. Yabashi et al., Visibility measurement with an X-ray interferometer using a coincidence technique, JPN J A P 2, 40(6B), 2001, pp. L646-L647
Citation: M. Yabashi et al., Characterization of the transverse coherence of hard synchrotron radiationby intensity interferometry - art. no. 140801, PHYS REV L, 8714(14), 2001, pp. 0801