Authors: Pomozov, YV Sosnin, MG Khirunenko, LI Yashnik, VI Abrosimov, NV Schroder, W Hohne, M

Citation: Yv. Pomozov et al., Oxygen-containing radiation defects in Si1-xGex, SEMICONDUCT, 34(9), 2000, pp. 989-993

Authors: Pomozov, YV Sosnin, MG Khirunenko, LI Yashnik, VI

Citation: Yv. Pomozov et al., Specific features of the behavior of oxygen in Sn-doped silicon, SEMICONDUCT, 34(9), 2000, pp. 994-997