Authors:
Medenbach, O
Dettmar, D
Shannon, RD
Fischer, RX
Yen, WM
Citation: O. Medenbach et al., Refractive index and optical dispersion of rare earth oxides using a small-prism technique, J OPT A-P A, 3(3), 2001, pp. 174-177
Citation: Ar. Fitzpatrick et Wm. Yen, The effects of test length and sample size on the reliability and equatingof tests composed of constructed-response items, APPL MEAS E, 14(1), 2001, pp. 31-57
Citation: Rs. Meltzer et al., Evidence for long-range interactions between rare-earth impurity ions in nanocrystals embedded in amorphous matrices with the two-level systems of the matrix - art. no. 100201, PHYS REV B, 6410(10), 2001, pp. 0201
Authors:
Shi, CS
Han, ZF
Huang, SH
Zhang, GB
Zimmerer, G
Beker, J
Kamada, M
Lu, LZ
Yen, WM
Citation: Cs. Shi et al., Temperature effects of Ce3+ emissions from Gd2SiO5 : Ce and their high excitation states, J ELEC SPEC, 103, 1999, pp. 633-635
Citation: Wy. Jia et al., Crystal growth and characterization of Eu2+, Dy3+: SrAl2O4 and Eu2+, Nd3+:CaAl2O4 by the LHPG method, J CRYST GR, 200(1-2), 1999, pp. 179-184