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Results: 1-11 |
Results: 11

Authors: Gorman, AL Yu, CG Ruenes, GR Daniels, L Yezierski, RP
Citation: Al. Gorman et al., Conditions affecting the onset, severity, and progression of a spontaneouspain-like behavior after excitotoxic spinal cord injury, J PAIN, 2(4), 2001, pp. 229-240

Authors: Yu, CG Jagid, J Ruenes, G Dietrich, WD Marcillo, AE Yezierski, RP
Citation: Cg. Yu et al., Detrimental effects of systemic hyperthermia on locomotor function and histopathological outcome after traumatic spinal cord injury in the rat, NEUROSURGER, 49(1), 2001, pp. 152-158

Authors: Plunkett, JA Yu, CG Easton, JM Bethea, JR Yezierski, RP
Citation: Ja. Plunkett et al., Effects of interleukin-10 (IL-10) on pain behavior and gene expression following excitotoxic spinal cord injury in the rat, EXP NEUROL, 168(1), 2001, pp. 144-154

Authors: Yu, CG Marcillo, AE Fairbanks, CA Wilcox, GL Yezierski, RP
Citation: Cg. Yu et al., Agmatine improves locomotor function and reduces tissue damage following spinal cord injury, NEUROREPORT, 11(14), 2000, pp. 3203-3207

Authors: Park, JT Chun, JY Kim, HK Jang, SJ Yu, CG
Citation: Jt. Park et al., New programming and erasing schemes for P-channel flash memory, IEEE ELEC D, 21(10), 2000, pp. 491-493

Authors: Fairbanks, CA Schreiber, KL Brewer, KL Yu, CG Stone, LS Kitto, KF Nguyen, HO Grocholski, BM Shoeman, DW Kehl, LJ Regunathan, S Reis, DJ Yezierski, RP Wilcox, GL
Citation: Ca. Fairbanks et al., Agmatine reverses pain induced by inflammation, neuropathy, and spinal cord injury, P NAS US, 97(19), 2000, pp. 10584-10589

Authors: Hong, SH Chun, JY Yu, CG Park, JT
Citation: Sh. Hong et al., The impacts of SILC and hot carrier induced drain leakage current on the refresh time in DRAM, MICROEL REL, 40(8-10), 2000, pp. 1555-1560

Authors: Yu, CG Jimenez, O Marcillo, AE Weider, B Bangerter, K Dietrich, WD Castro, S Yezierski, RP
Citation: Cg. Yu et al., Beneficial effects of modest systemic hypothermia on locomotor function and histopathological damage following contusion-induced spinal cord injury in rats, J NEUROSURG, 93(1), 2000, pp. 85-93

Authors: Park, JT Lee, BJ Kim, DW Yu, CG Yu, HK
Citation: Jt. Park et al., RF performance degradation in nMOS transistors due to hot carrier effects, IEEE DEVICE, 47(5), 2000, pp. 1068-1072

Authors: Hong, SH Nam, SM Yun, BO Lee, BJ Yu, CG Park, JT
Citation: Sh. Hong et al., Temperature dependence of hot carrier induced MOSFET degradation at low gate bias, MICROEL REL, 39(6-7), 1999, pp. 809-814

Authors: Zhang, H Yu, CG
Citation: H. Zhang et Cg. Yu, Laser shock processing of 2024-T62 aluminum alloy, MAT SCI E A, 257(2), 1998, pp. 322-327
Risultati: 1-11 |