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Results:
1-22
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Results: 22
Authors:
Barranco, A
Holgado, JP
Yubero, F
Espinos, JP
Martin, A
Gonzalez-Elipe, AR
Citation: A. Barranco et al., Near edge x-ray absorption fine structure spectroscopy study of atomic nitrogen implanted in Al2O3 by low energy N-2(+) bombardment, J VAC SCI A, 19(3), 2001, pp. 1024-1026
Authors:
Barranco, A
Mejias, JA
Espinos, JP
Caballero, A
Gonzalez-Elipe, AR
Yubero, F
Citation: A. Barranco et al., Chemical stability of Sin+ species in SiOx (x < 2) thin films, J VAC SCI A, 19(1), 2001, pp. 136-144
Authors:
Barranco, A
Yubero, F
Espinos, JP
Benitez, J
Gonzalez-Elipe, AR
Cotrino, J
Allain, J
Girardeau, T
Riviere, JP
Citation: A. Barranco et al., Room temperature synthesis of SiO2 thin films by ion beam induced and plasma enhanced CVD, SURF COAT, 142, 2001, pp. 856-860
Authors:
Gervasoni, JL
Yubero, F
Citation: Jl. Gervasoni et F. Yubero, Bulk and surface plasmon excitation induced by charged particles moving near a solid surface, NUCL INST B, 182, 2001, pp. 96-101
Authors:
Barranco, A
Yubero, F
Espinos, JP
Gonzalez-Eipe, AR
Citation: A. Barranco et al., The chemical state vector: a new concept for the characterization of oxideinterfaces, SURF INT AN, 31(8), 2001, pp. 761-767
Authors:
Barranco, A
Yubero, F
Cotrino, J
Espinos, JP
Benitez, J
Rojas, TC
Allain, J
Girardeau, T
Reviere, JP
Gonzalez-Elipe, AR
Citation: A. Barranco et al., Low temperature synthesis of dense SiO2 thin films by ion beam induced chemical vapor deposition, THIN SOL FI, 396(1-2), 2001, pp. 9-15
Authors:
Holgado, JP
Espinos, JP
Yubero, F
Justo, A
Ocana, M
Benitez, J
Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Ar stabilisation of the cubic/tetragonal phases of ZrO2 in thin films prepared by ion beam induced chemical vapour deposition, THIN SOL FI, 389(1-2), 2001, pp. 34-42
Authors:
Holgado, JP
Barranco, A
Yubero, F
Espinos, JP
Gonzalez-Elipe, AR
Citation: Jp. Holgado et al., Surface microstructure of MgO deposited on SiO2 by analysis of plasmon excitations in photoemission experiments, SURF SCI, 482, 2001, pp. 1325-1330
Authors:
Barranco, A
Yubero, F
Mejias, JA
Espinos, JP
Gonzalez-Elipe, AR
Citation: A. Barranco et al., Electronic interactions at SiO2/M ' O-x (M ': Al, Ti) oxide interfaces, SURF SCI, 482, 2001, pp. 680-686
Authors:
Yubero, F
Ocana, M
Caballero, A
Gonzalez-Elipe, AR
Citation: F. Yubero et al., Structural modifications produced by the incorporation of Ar within the lattice of Fe2O3 thin films prepared by ion beam induced chemical vapour deposition, ACT MATER, 48(18-19), 2000, pp. 4555-4561
Authors:
Yubero, F
Ocana, M
Justo, A
Contreras, L
Gonzalez-Elipe, AR
Citation: F. Yubero et al., Iron oxide thin films prepared by ion beam induced chemical vapor deposition: Structural characterization by infrared spectroscopy, J VAC SCI A, 18(5), 2000, pp. 2244-2248
Authors:
Gonzalez-Elipe, AR
Yubero, F
Espinos, JP
Caballero, A
Ocana, M
Holgado, JP
Morales, J
Citation: Ar. Gonzalez-elipe et al., Amorphisation and related structural effects in thin films prepared by ionbeam assisted methods, SURF COAT, 125(1-3), 2000, pp. 116-123
Authors:
Sanchez-Agudo, M
Yubero, F
Fuentes, GG
Gutierrez, A
Sacchi, M
Soriano, L
Sanz, JM
Citation: M. Sanchez-agudo et al., Study of the growth of ultrathin films of NiO on Cu(111), SURF INT AN, 30(1), 2000, pp. 396-400
Authors:
Yubero, F
Barranco, A
Mejias, JA
Espinos, JP
Gonzalez-Elipe, AR
Citation: F. Yubero et al., Spectroscopic characterisation and chemical reactivity of silicon monoxidelayers deposited on Cu(100), SURF SCI, 458(1-3), 2000, pp. 229-238
Authors:
Yubero, F
Gonzalez-Elipe, AR
Tougaard, S
Citation: F. Yubero et al., Determination of growth mechanisms by X-ray photoemission acid ion scattering spectroscopies: application to thin iron oxide films deposited on SiO2, SURF SCI, 457(1-2), 2000, pp. 24-36
Authors:
Reiche, R
Yubero, F
Espinos, JP
Gonzalez-Elipe, AR
Citation: R. Reiche et al., Structure, microstructure and electronic characterisation of the Al2O3/SiO2 interface by electron spectroscopies, SURF SCI, 457(1-2), 2000, pp. 199-210
Authors:
Gonzalez-Elipe, AR
Espinos, JP
Barranco, A
Yubero, F
Caballero, A
Citation: Ar. Gonzalez-elipe et al., CVD induced by ion beams for the preparation of oxide and nitride thin films, J PHYS IV, 9(P8), 1999, pp. 699-708
Authors:
Jimenez, VM
Espinos, JP
Gonzalez-Elipe, AR
Caballero, A
Yubero, F
Citation: Vm. Jimenez et al., SnO2 thin films prepared by ion beam induced CVD. Preparation and characterization, J PHYS IV, 9(P8), 1999, pp. 749-755
Authors:
Jimenez, VM
Lassaletta, G
Fernandez, A
Espinos, JP
Yubero, F
Gonzalez-Elipe, AR
Soriano, L
Sanz, JM
Papaconstantopoulos, DA
Citation: Vm. Jimenez et al., Resonant photoemission characterization of SnO, PHYS REV B, 60(15), 1999, pp. 11171-11179
Authors:
Simonsen, AC
Yubero, F
Tougaard, S
Citation: Ac. Simonsen et al., Analysis of angle-resolved electron energy loss in XPS spectra of Ag, Au, Co, Cu, Fe and Si, SURF SCI, 436(1-3), 1999, pp. 149-159
Authors:
Yubero, F
Barranco, A
Espinos, JP
Gonzalez-Elipe, AR
Citation: F. Yubero et al., Anomalous behaviour in resonant Auger emission of SiOx thin films, SURF SCI, 436(1-3), 1999, pp. 202-212
Authors:
Fuentes, GG
Mancheno, IG
Balbas, F
Quiros, C
Trigo, JF
Yubero, F
Elizalde, E
Sanz, JM
Citation: Gg. Fuentes et al., Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry, PHYS ST S-A, 175(1), 1999, pp. 429-436
Risultati:
1-22
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