Authors: Yurjev, GS Nazmov, VP Kondratjev, VI Sheromov, MA Korchagin, MA

Citation: Gs. Yurjev et al., The structure study of thin semiconductor and dielectric layers by synchrotron radiation diffraction, NUCL INST A, 448(1-2), 2000, pp. 286-289

Authors: Fainer, NI Rumyantsev, YM Kosinova, ML Zemskova, SM Maximovskiy, EA Yurjev, GS Sivykh, GF

Citation: Ni. Fainer et al., The structure study of thin cadmium and copper sulphide films by diffraction of synchrotron radiation, NUCL INST A, 448(1-2), 2000, pp. 290-293

Authors: Fainer, NI Kosinova, ML Yurjev, GS Maximovski, EA Rumyantsev, YM Asanov, IP

Citation: Ni. Fainer et al., The structure study of thin boron and silicon carbonitride films by diffraction of synchrotron radiation, NUCL INST A, 448(1-2), 2000, pp. 294-298