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Results: 8

Authors: SWAMINATHAN S ALTYNOV S JONES IP ZALUZEC NJ MAHER DM FRASER HL
Citation: S. Swaminathan et al., PRECISE AND ACCURATE REFINEMENTS OF THE 220 STRUCTURE FACTOR FOR SILICON BY THE SYSTEMATIC-ROW CBED METHOD, Ultramicroscopy, 69(3), 1997, pp. 169-183

Authors: TRENT JD KAGAWA HK YAOI T OLLE E ZALUZEC NJ
Citation: Jd. Trent et al., CHAPERONIN FILAMENTS - THE ARCHAEAL CYTOSKELETON, Proceedings of the National Academy of Sciences of the United Statesof America, 94(10), 1997, pp. 5383-5388

Authors: SMITH KL ZALUZEC NJ LUMPKIN GR
Citation: Kl. Smith et al., IN-SITU STUDIES OF ION-IRRADIATED ZIRCONOLITE, PYROCHLORE AND PEROVSKITE, Journal of nuclear materials, 250(1), 1997, pp. 36-52

Authors: CHUNG HM RUTHER WE SANECKI JE HINS A ZALUZEC NJ KASSNER TF
Citation: Hm. Chung et al., IRRADIATION-ASSISTED STRESS-CORROSION CRACKING OF AUSTENITIC STAINLESS-STEELS - RECENT PROGRESS AND NEW APPROACHES, Journal of nuclear materials, 239(1-3), 1996, pp. 61-79

Authors: SAUNDERS M BIRD DM ZALUZEC NJ BURGESS WG PRESTON AR HUMPHREYS CJ
Citation: M. Saunders et al., MEASUREMENT OF LOW-ORDER STRUCTURE FACTORS FOR SILICON FROM ZONE-AXISCBED PATTERNS, Ultramicroscopy, 60(2), 1995, pp. 311-323

Authors: ZALUZEC NJ
Citation: Nj. Zaluzec, MICROSCOPY BY E-MAIL, Microscopy microanalysis microstructures, 5(2), 1994, pp. 180000001-180000002

Authors: BURGESS WG PRESTON AR BOTTON GA ZALUZEC NJ HUMPHREYS CJ
Citation: Wg. Burgess et al., BENEFITS OF ENERGY-FILTERING FOR ADVANCED CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS, Ultramicroscopy, 55(3), 1994, pp. 276-283

Authors: SWAMINATHAN S JONES IP ZALUZEC NJ MAHER DM FRASER HL
Citation: S. Swaminathan et al., EXPERIMENTAL-DETERMINATION OF LOW-ORDER STRUCTURE FACTORS IN THE INTERMETALLIC COMPOUND TIAL, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 170(1-2), 1993, pp. 227-235
Risultati: 1-8 |