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TEICHERT J
BISCHOFF L
HESSE E
SCHNEIDER P
PANKNIN D
GESSNER T
LOBNER B
ZICHNER N
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Authors:
TEICHERT J
BISCHOFF L
HESSE E
SCHNEIDER P
PANKNIN D
GESSNER T
LOBNER B
ZICHNER N
Citation: J. Teichert et al., COMPARISON OF COSI2 INTERCONNECTION LINES ON CRYSTALLINE AND NONCRYSTALLINE SILICON FABRICATED BY WRITING FOCUSED ION-BEAM IMPLANTATION, Applied surface science, 91(1-4), 1995, pp. 44-49
Authors:
KAUFMANN C
BAUMANN J
GESSNER T
RASCHKE T
RENNAU M
ZICHNER N
Citation: C. Kaufmann et al., ELECTRICAL CHARACTERIZATION OF REACTIVELY SPUTTERED TIN DIFFUSION BARRIER LAYERS FOR COPPER METALLIZATION, Applied surface science, 91(1-4), 1995, pp. 291-294