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Authors: ARAI E ZOUNEK A SEKINO N SAITO K
Citation: E. Arai et al., ANALYSIS OF BORON-DOPED AMORPHOUS-SILICON BY MEANS OF A HEAVY-ION TIME-OF-FLIGHT ERD SPECTROMETER, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 89(1-4), 1994, pp. 149-152

Authors: ARAI E ZOUNEK A SEKINO M TAKEMOTO K NITTONO O
Citation: E. Arai et al., DEPTH PROFILING OF POROUS SILICON SURFACE BY MEANS OF HEAVY-ION TOF ERDA, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 226-229

Authors: ZOUNEK A SPALT H MATERLIK G
Citation: A. Zounek et al., COHERENT X-RAY-SCATTERING BY PHONONS - PHONON EIGENVECTORS IN SI AND GAAS, Zeitschrift fur Physik. B, Condensed matter, 92(1), 1993, pp. 21-33

Authors: ARAI E ZOUNEK A SAITO K
Citation: E. Arai et al., PROFILING OF SEMICONDUCTOR SURFACE-LAYERS BY HEAVY-ION TOF-E-ERD, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 79(1-4), 1993, pp. 518-520

Authors: ZOUNEK A KRESSLER J ARAI E INOUE T
Citation: A. Zounek et al., OXYGEN ENRICHMENT ON POLYMER SURFACES MEASURED BY HEAVY-ION ELASTIC RECOIL DETECTION, Polymer, 34(18), 1993, pp. 3948-3950
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